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Citation: It. Sylla et al., JOINT DESIGN AND TEST CONSIDERATION IN HIGH-FREQUENCY CIRCUITS, Microwave and optical technology letters, 16(3), 1997, pp. 132-138

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Citation: T. Tsao et al., AMBIGUITY FUNCTION FOR A BISTATIC RADAR, IEEE transactions on aerospace and electronic systems, 33(3), 1997, pp. 1041-1051

Authors: SLAMANI M KAMINSKA B

Citation: M. Slamani et B. Kaminska, FAULT OBSERVABILITY ANALYSIS OF ANALOG CIRCUITS IN FREQUENCY-DOMAIN, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 43(2), 1996, pp. 134-139

Authors: SLAMANI M KAMINSKA B

Citation: M. Slamani et B. Kaminska, MULTIFREQUENCY ANALYSIS OF FAULTS IN ANALOG CIRCUITS, IEEE design & test of computers, 12(2), 1995, pp. 70-80