Citation: K. Somogyi, SOME CRITICAL CONDITIONS OF THE THERMAL BREAKDOWN IN SEMICONDUCTORS, Sensors and actuators. A, Physical, 71(1-2), 1998, pp. 58-62
Authors:
ROBERT C
BIDEUX L
GRUZZA B
LOHNER T
FRIED M
BARNA A
SOMOGYI K
GERGELY G
Citation: C. Robert et al., ELLIPSOMETRY OF AL2O3 THIN-FILMS DEPOSITED ON SI AND INP, Semiconductor science and technology, 12(11), 1997, pp. 1429-1432
Citation: B. Podor et al., PHOTOLUMINESCENCE AND DOUBLE-CRYSTAL X-RAY STUDY OF INGAAS INP - EFFECT OF RARE-EARTH (DYSPROSIUM) ADDITION DURING LIQUID-PHASE EPITAXIAL-GROWTH/, Acta Physica Polonica. A, 87(2), 1995, pp. 465-468
Citation: K. Somogyi et G. Safran, HYSTERESIS OF THE PHASE-TRANSFORMATION DETECTED BY GALVANOMAGNETIC MEASUREMENTS OF AG2SE LAYERS, Journal of applied physics, 78(11), 1995, pp. 6855-6857
Authors:
THEYS B
MACHAYEKHI B
CHEVALLIER J
SOMOGYI K
ZAHRAMAN K
GIBART P
MILOCHE M
Citation: B. Theys et al., INTERACTIONS BETWEEN HYDROGEN AND GROUP-VI DONORS IN GAAS AND GAALAS, Journal of applied physics, 77(7), 1995, pp. 3186-3193
Citation: K. Somogyi, ANGLE-DEPENDENT MAGNETORESISTANCE MEASUREMENTS ON EPITAXIAL GAAS-LAYERS GROWN ON CONDUCTIVE SUBSTRATES, Semiconductor science and technology, 8(10), 1993, pp. 1834-1841
Citation: K. Somogyi, MEASUREMENT OF THE RESISTANCE OF METAL-SEMICONDUCTOR-METAL STRUCTURESUSING THE GEOMETRICAL MAGNETORESISTANCE TECHNIQUE - COMMENTS, Solid-state electronics, 36(11), 1993, pp. 1651-1651