Authors: ELLENBERGER U SOOM B BALMER JE

Citation: U. Ellenberger et al., CHARACTERIZATION OF AN X-RAY STREAK CAMERA AT 18.2NM, Measurement science & technology, 4(8), 1993, pp. 874-880

Authors: TURCU ICE ROSS IN HENING A STEYER M SOOM B WATSON JG HERMAN P

Citation: Ice. Turcu et al., X-RAY-LITHOGRAPHY WITH EFFICIENT PICOSECOND KRF LASER-PLASMA SOURCE AT 1NM WAVELENGTH, Microelectronic engineering, 21(1-4), 1993, pp. 95-98

Authors: CHEN H SOOM B YAAKOBI B UCHIDA S MEYERHOFER DD

Citation: H. Chen et al., HOT-ELECTRON CHARACTERIZATION FROM K-ALPHA MEASUREMENTS IN HIGH-CONTRAST, P-POLARIZED, PICOSECOND LASER-PLASMA INTERACTIONS, Physical review letters, 70(22), 1993, pp. 3431-3434

Authors: ELLENBERGER U SOOM B GLINZ A BALMER JE

Citation: U. Ellenberger et al., TIME-RESOLVED PROFILES OF ELECTRON-DENSITY AND TEMPERATURE IN LASER-IRRADIATED CYLINDRICAL CAVITIES, Optics communications, 104(1-3), 1993, pp. 65-70

Authors: SOOM B CHEN H FISHER Y MEYERHOFER DD

Citation: B. Soom et al., STRONG K-ALPHA EMISSION IN PICOSECOND LASER-PLASMA INTERACTIONS, Journal of applied physics, 74(9), 1993, pp. 5372-5377