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Results: 1-25 | 26-34 |
Results: 26-34/34
ON THE AVERAGE COULOMB POTENTIAL (PHI(0)) AND CONSTRAINTS ON THE ELECTRON-DENSITY IN CRYSTALS
Authors: OKEEFFE M SPENCE JCH
Citation: M. Okeeffe et Jch. Spence, ON THE AVERAGE COULOMB POTENTIAL (PHI(0)) AND CONSTRAINTS ON THE ELECTRON-DENSITY IN CRYSTALS, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 33-45
LATTICE TRAPPING AND SURFACE RECONSTRUCTION FOR SILICON CLEAVAGE ON (111) - AB-INITIO QUANTUM MOLECULAR-DYNAMICS CALCULATIONS
Authors: SPENCE JCH HUANG YM SANKEY O
Citation: Jch. Spence et al., LATTICE TRAPPING AND SURFACE RECONSTRUCTION FOR SILICON CLEAVAGE ON (111) - AB-INITIO QUANTUM MOLECULAR-DYNAMICS CALCULATIONS, Acta metallurgica et materialia, 41(10), 1993, pp. 2815-2824
COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES
Authors: HOLMESTAD R KRIVANEK OL HOIER R MARTHINSEN K SPENCE JCH
Citation: R. Holmestad et al., COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES, Ultramicroscopy, 52(3-4), 1993, pp. 454-458
EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES
Authors: SPENCE JCH QIAN W MELMED AJ
Citation: Jch. Spence et al., EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES, Ultramicroscopy, 52(3-4), 1993, pp. 473-477
ASPECTS OF ELECTRON-MICROSCOPY, DIFFRACTION, CRYSTALLOGRAPHY AND SPECTROSCOPY - PROCEEDINGS OF THE COWLEY,JOHN,M. SYMPOSIUM ON ASPECTS OF ELECTRON-MICROSCOPY, DIFFRACTION, CRYSTALLOGRAPHY AND SPECTROSCOPY - FOREWORD
Authors: SMITH DJ SPENCE JCH
Citation: Dj. Smith et Jch. Spence, ASPECTS OF ELECTRON-MICROSCOPY, DIFFRACTION, CRYSTALLOGRAPHY AND SPECTROSCOPY - PROCEEDINGS OF THE COWLEY,JOHN,M. SYMPOSIUM ON ASPECTS OF ELECTRON-MICROSCOPY, DIFFRACTION, CRYSTALLOGRAPHY AND SPECTROSCOPY - FOREWORD, Ultramicroscopy, 52(3-4), 1993, pp. 210000003-210000004
INVESTIGATION OF STM IMAGE ARTIFACTS BY INSITU REFLECTION ELECTRON-MICROSCOPY
Authors: LO WK SPENCE JCH
Citation: Wk. Lo et Jch. Spence, INVESTIGATION OF STM IMAGE ARTIFACTS BY INSITU REFLECTION ELECTRON-MICROSCOPY, Ultramicroscopy, 48(4), 1993, pp. 433-444
COHERENT ELECTRON NANODIFFRACTION FROM PERFECT AND IMPERFECT CRYSTALS
Authors: ZUO JM SPENCE JCH
Citation: Jm. Zuo et Jch. Spence, COHERENT ELECTRON NANODIFFRACTION FROM PERFECT AND IMPERFECT CRYSTALS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 68(5), 1993, pp. 1055-1078
BRIGHTNESS MEASUREMENTS OF NANOMETER-SIZED FIELD-EMISSION-ELECTRON SOURCES
Authors: QIAN W SCHEINFEIN MR SPENCE JCH
Citation: W. Qian et al., BRIGHTNESS MEASUREMENTS OF NANOMETER-SIZED FIELD-EMISSION-ELECTRON SOURCES, Journal of applied physics, 73(11), 1993, pp. 7041-7045
ELECTRON HOLOGRAPHIC STUDY OF FERROELECTRIC DOMAIN-WALLS - COMMENT
Authors: SPENCE JCH COWLEY JM ZUO JM
Citation: Jch. Spence et al., ELECTRON HOLOGRAPHIC STUDY OF FERROELECTRIC DOMAIN-WALLS - COMMENT, Applied physics letters, 62(19), 1993, pp. 2446-2447
Risultati: 1-25 | 26-34 |