Authors:
TRIFTSHAUSER W
KOGEL G
SPERR P
BRITTON DT
UHLMANN K
WILLUTZKI P
Citation: W. Triftshauser et al., A SCANNING POSITRON MICROSCOPE FOR DEFECT ANALYSIS IN MATERIALS SCIENCE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 264-269
Citation: G. Kogel et al., INVESTIGATION OF DEFECT STRUCTURES IN DEFORMED AND HELIUM-IRRADIATED REFRACTORY-METALS BY POSITRON-ANNIHILATION, Journal of physics. Condensed matter, 5(23), 1993, pp. 3987-4006