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Results: 1-11 |
Results: 11

Authors: OSIANDER R SPICER JWM
Citation: R. Osiander et Jwm. Spicer, TIME-RESOLVED INFRARED RADIOMETRY WITH STEP HEATING - A REVIEW, Revue generale de thermique, 37(8), 1998, pp. 680-692

Authors: SPICER JWM OSIANDER R CHAMPION JL SPICER JB
Citation: Jwm. Spicer et al., COMPARISON OF TIME-RESOLVED THERMOGRAPHY AND SHEAROGRAPHY FOR NDE, Progress in Natural Science, 6, 1996, pp. 72-75

Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE INTERFACE IMAGING, Progress in Natural Science, 6, 1996, pp. 154-157

Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., MICROWAVE-SOURCE TIME-RESOLVED INFRARED RADIOMETRY FOR MONITORING OF CURING AND DEPOSITION PROCESSES, Progress in Natural Science, 6, 1996, pp. 181-184

Authors: SPICER JWM OSIANDER R MURPHY JC CHANG Y HILDEBRAND R
Citation: Jwm. Spicer et al., TIME-RESOLVED MICROWAVE THERMOREFLECTOMETRY FOR EVALUATION OF DIELECTRIC-METAL INTERFACES, Progress in Natural Science, 6, 1996, pp. 239-242

Authors: SPICER JB CHAMPION JL OSIANDER R SPICER JWM
Citation: Jb. Spicer et al., TIME-RESOLVED SHEAROGRAPHIC AND THERMOGRAPHIC NDE METHODS FOR GRAPHITE EPOXY HONEYCOMB COMPOSITE/, Materials evaluation, 54(10), 1996, pp. 1210-1213

Authors: SPICER JWM OSIANDER R
Citation: Jwm. Spicer et R. Osiander, TIME-DEPENDENT TEMPERATURE DISTRIBUTIONS FOR NONDESTRUCTIVE PROBING OF MATERIAL PROPERTIES, Johns Hopkins APL technical digest, 16(3), 1995, pp. 278-287

Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., THERMAL NONDESTRUCTIVE EVALUATION USING MICROWAVE SOURCES, Materials evaluation, 53(8), 1995, pp. 942-948

Authors: SPICER JWM OSIANDER R AAMODT LC MURPHY JC
Citation: Jwm. Spicer et al., CHARACTERIZATION OF BACK SURFACE-MORPHOLOGY FOR CORROSION DETECTION USING PATTERNED HEAT-SOURCES, Journal de physique. IV, 4(C7), 1994, pp. 59-62

Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., MICROWAVE-INDUCED TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE DEFECT DETECTION AND CHARACTERIZATION, Journal de physique. IV, 4(C7), 1994, pp. 563-566

Authors: CHANG GY GIVENS RB SPICER JWM OSIANDER R MURPHY JC
Citation: Gy. Chang et al., OPTICAL BEAM DEFLECTION IMAGING OF THE ELECTRON-BEAM INTERACTION VOLUME IN SEMICONDUCTORS, Applied physics letters, 63(5), 1993, pp. 645-647
Risultati: 1-11 |