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Results: 1-18 |
Results: 18
PHASE-CONTRAST RADIOGRAPHY
Authors: GAO DC POGANY A STEVENSON AW WILKINS SW
Citation: Dc. Gao et al., PHASE-CONTRAST RADIOGRAPHY, Radiographics, 18(5), 1998, pp. 1257-1267
MODEL-INDEPENDENT DETERMINATION OF 2D STRAIN DISTRIBUTION IN ION-IMPLANTED SILICON-CRYSTALS FROM X-RAY-DIFFRACTION DATA
Authors: NIKULIN AY STEVENSON AW HASHIZUME H COOKSON D HOBLER G WILKINS SW
Citation: Ay. Nikulin et al., MODEL-INDEPENDENT DETERMINATION OF 2D STRAIN DISTRIBUTION IN ION-IMPLANTED SILICON-CRYSTALS FROM X-RAY-DIFFRACTION DATA, Semiconductor science and technology, 12(3), 1997, pp. 350-354
X-RAY PHASE-CONTRAST RADIOGRAPHY
Authors: WILKINS SW GAO D GUREYEV T POGANY A STEVENSON AW
Citation: Sw. Wilkins et al., X-RAY PHASE-CONTRAST RADIOGRAPHY, Radiology, 205, 1997, pp. 907-907
DIRECT MEASURE OF THE PHASE-SHIFT OF AN X-RAY-BEAM
Authors: DAVIS TJ STEVENSON AW
Citation: Tj. Davis et Aw. Stevenson, DIRECT MEASURE OF THE PHASE-SHIFT OF AN X-RAY-BEAM, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(6), 1996, pp. 1193-1198
ELECTRON-DENSITY MAPS FOR THE SI(1-1-1) 7X7 SURFACE CALCULATED WITH THE MAXIMUM-ENTROPY TECHNIQUE USING X-RAY AND ELECTRON-DIFFRACTION DATA
Authors: CARVALHO CAM HASHIZUME H STEVENSON AW ROBINSON IK
Citation: Cam. Carvalho et al., ELECTRON-DENSITY MAPS FOR THE SI(1-1-1) 7X7 SURFACE CALCULATED WITH THE MAXIMUM-ENTROPY TECHNIQUE USING X-RAY AND ELECTRON-DIFFRACTION DATA, Physica. B, Condensed matter, 221(1-4), 1996, pp. 469-486
MODEL-INDEPENDENT DETERMINATION OF THE STRAIN DISTRIBUTION FOR A SI0.9GE0.1 SI SUPERLATTICE USING X-RAY-DIFFRACTOMETRY DATA/
Authors: NIKULIN AY STEVENSON AW HASHIZUME H
Citation: Ay. Nikulin et al., MODEL-INDEPENDENT DETERMINATION OF THE STRAIN DISTRIBUTION FOR A SI0.9GE0.1 SI SUPERLATTICE USING X-RAY-DIFFRACTOMETRY DATA/, Physical review. B, Condensed matter, 53(13), 1996, pp. 8277-8282
PHASE-CONTRAST IMAGING USING POLYCHROMATIC HARD X-RAYS
Authors: WILKINS SW GUREYEV TE GAO D POGANY A STEVENSON AW
Citation: Sw. Wilkins et al., PHASE-CONTRAST IMAGING USING POLYCHROMATIC HARD X-RAYS, Nature, 384(6607), 1996, pp. 335-338
REFLECTIVITY CURVES OF BRAGG-REFLECTIONS FROM SMALL IMPERFECT SINGLE-CRYSTALS
Authors: MATHIESON AM STEVENSON AW
Citation: Am. Mathieson et Aw. Stevenson, REFLECTIVITY CURVES OF BRAGG-REFLECTIONS FROM SMALL IMPERFECT SINGLE-CRYSTALS, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 391-398
CONSIDERATION OF SEVERAL FACTORS IN THE METHOD FOR MAPPING X-RAY ROCKING CURVES
Authors: GAO DC WILKINS SW STEVENSON AW POGANY AP
Citation: Dc. Gao et al., CONSIDERATION OF SEVERAL FACTORS IN THE METHOD FOR MAPPING X-RAY ROCKING CURVES, Review of scientific instruments, 66(9), 1995, pp. 4492-4495
X-RAY IMAGE-CONTRAST FROM A SIMPLE PHASE OBJECT
Authors: DAVIS TJ GUREYEV TE GAO D STEVENSON AW WILKINS SW
Citation: Tj. Davis et al., X-RAY IMAGE-CONTRAST FROM A SIMPLE PHASE OBJECT, Physical review letters, 74(16), 1995, pp. 3173-3176
PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS
Authors: DAVIS TJ GAO D GUREYEV TE STEVENSON AW WILKINS SW
Citation: Tj. Davis et al., PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS, Nature, 373(6515), 1995, pp. 595-598
HIGH-RESOLUTION MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN ION-IMPLANTED CRYSTALS FROM X-RAY-DIFFRACTOMETRY DATA
Authors: NIKULIN AY GUREYEV TE STEVENSON AW WILKINS SW HASHIZUME H COOKSON D
Citation: Ay. Nikulin et al., HIGH-RESOLUTION MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN ION-IMPLANTED CRYSTALS FROM X-RAY-DIFFRACTOMETRY DATA, Journal of applied crystallography, 28, 1995, pp. 803-811
HIGH-RESOLUTION TRIPLE-CRYSTAL X-RAY-DIFFRACTION EXPERIMENTS PERFORMED AT THE AUSTRALIAN NATIONAL BEAMLINE FACILITY ON A SILICON SAMPLE WITH LATERAL PERIODIC SUPERSTRUCTURE
Authors: NIKULIN AY STEVENSON AW HASHIZUME H WILKINS SW COOKSON D FORAN G GARRETT RF
Citation: Ay. Nikulin et al., HIGH-RESOLUTION TRIPLE-CRYSTAL X-RAY-DIFFRACTION EXPERIMENTS PERFORMED AT THE AUSTRALIAN NATIONAL BEAMLINE FACILITY ON A SILICON SAMPLE WITH LATERAL PERIODIC SUPERSTRUCTURE, Journal of applied crystallography, 28, 1995, pp. 57-60
THERMAL VIBRATIONS AND BONDING IN GAAS - AN EXTENDED-FACE CRYSTAL STUDY
Authors: STEVENSON AW
Citation: Aw. Stevenson, THERMAL VIBRATIONS AND BONDING IN GAAS - AN EXTENDED-FACE CRYSTAL STUDY, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 621-632
ON THE MODELING OF NEUTRON-DIFFRACTION REFLECTIONS FROM SMALL SINGLE-CRYSTALS
Authors: MATHIESON AM STEVENSON AW
Citation: Am. Mathieson et Aw. Stevenson, ON THE MODELING OF NEUTRON-DIFFRACTION REFLECTIONS FROM SMALL SINGLE-CRYSTALS, Acta crystallographica. Section A, Foundations of crystallography, 49, 1993, pp. 655-661
MEASUREMENT OF RADII OF CURVATURE OF SLIGHTLY BENT CRYSTALS USING A ONE-DIMENSIONAL DETECTOR
Authors: GAO DC WILKINS SW STEVENSON AW POGANY AP
Citation: Dc. Gao et al., MEASUREMENT OF RADII OF CURVATURE OF SLIGHTLY BENT CRYSTALS USING A ONE-DIMENSIONAL DETECTOR, Review of scientific instruments, 64(9), 1993, pp. 2561-2565
NEAR-SURFACE REGION CHARACTERIZATION BY EXTREMELY ASYMMETRIC BRAGG REFLECTION TOPOGRAPHY
Authors: GAO D WILKINS SW STEVENSON AW PAIN GN
Citation: D. Gao et al., NEAR-SURFACE REGION CHARACTERIZATION BY EXTREMELY ASYMMETRIC BRAGG REFLECTION TOPOGRAPHY, Journal of applied physics, 74(5), 1993, pp. 3126-3130
DETERMINATION OF THE UNIT-CELL FOR AN EPITAXIAL LAYER OF HG1-XCDXTE DEPOSITED ON GAAS
Authors: ZHU NC STEVENSON AW LI RS
Citation: Nc. Zhu et al., DETERMINATION OF THE UNIT-CELL FOR AN EPITAXIAL LAYER OF HG1-XCDXTE DEPOSITED ON GAAS, Australian journal of physics, 45(6), 1992, pp. 773-779
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