Authors: SIDDIQUI SA NANDAN D GUPTA S SUBHARWAL M

Citation: Sa. Siddiqui et al., A NEW INCREASING FAILURE RATE MODEL FOR LIFE TIME DATA, Microelectronics and reliability, 35(1), 1995, pp. 109-111

Authors: SIDDIQUI SA SUBHARWAL M GUPTA S",BALKRISHAN

Citation: Sa. Siddiqui et al., FINITE-RANGE SURVIVAL MODEL, Microelectronics and reliability, 34(8), 1994, pp. 1377-1380