Citation: Mj. Brennan et al., ALTERNATIVE FACTOR SPECIFICATIONS, SECURITY CHARACTERISTICS, AND THE CROSS-SECTION OF EXPECTED STOCK RETURNS, Journal of financial economics, 49(3), 1998, pp. 345-373
Citation: K. Daniel et al., INVESTOR PSYCHOLOGY AND SECURITY MARKET UNDERREACTIONS AND OVERREACTIONS, The Journal of finance (New York), 53(6), 1998, pp. 1839-1885
Citation: A. Subrahmanyam, THE MICROSTRUCTURE OF FOREIGN-EXCHANGE MARKETS - FRANKEL,JA, GALLI,G,GIOVANNI,A, Journal of economic literature, 35(3), 1997, pp. 1383-1384
Citation: Cw. Holden et A. Subrahmanyam, RISK-AVERSION, LIQUIDITY, AND ENDOGENOUS SHORT HORIZONS, The Review of financial studies, 9(2), 1996, pp. 691-722
Citation: Mj. Brennan et A. Subrahmanyam, MARKET MICROSTRUCTURE AND ASSET PRICING - ON THE COMPENSATION FOR ILLIQUIDITY IN STOCK RETURNS, Journal of financial economics, 41(3), 1996, pp. 441-464
Citation: Cs. Kumar et al., AUTOMATED REED-TYPE KELVIN PROBE FOR WORK FUNCTION AND SURFACE PHOTOVOLTAGE STUDIES, Review of scientific instruments, 67(3), 1996, pp. 805-808
Authors:
SURESH MS
SUBRAHMANYAM A
SATHYANARAYANA P
SETH R
Citation: Ms. Suresh et al., NEED AND EFFECT OF RECONDITIONING OF NICKEL HYDROGEN BATTERIES/, IEEE aerospace and electronic systems magazine, 10(4), 1995, pp. 26-29
Citation: Mj. Brennan et A. Subrahmanyam, INVESTMENT ANALYSIS AND PRICE FORMATION IN SECURITIES MARKETS, Journal of financial economics, 38(3), 1995, pp. 361-381
Citation: V. Vasu et al., TRANSPORT MECHANISM OF SPRAY PYROLYTIC-GROWN INDIUM TIN OXIDE INDIUM-PHOSPHIDE JUNCTIONS, Journal of applied physics, 77(10), 1995, pp. 5220-5224
Citation: H. Choi et A. Subrahmanyam, USING INTRADAY DATA TO TEST FOR EFFECTS OF INDEX FUTURES ON THE UNDERLYING STOCK MARKETS, The journal of futures markets, 14(3), 1994, pp. 293-322
Citation: Cw. Holden et A. Subrahmanyam, RISK-AVERSION, IMPERFECT COMPETITION, AND LONG-LIVED INFORMATION, Economics letters, 44(1-2), 1994, pp. 181-190
Citation: P. Manivannan et A. Subrahmanyam, THE DOMINANT SCATTERING MECHANISMS IN TIN-DOPED INDIUM OXIDE THIN-FILMS - REPLY, Journal of physics. D, Applied physics, 27(5), 1994, pp. 1085-1085
Citation: P. Manivannan et A. Subrahmanyam, ELECTRICAL CHARACTERIZATION OF ELECTRON-BEAM EVAPORATED INDIUM TIN OXIDE INDIUM-PHOSPHIDE JUNCTIONS, Journal of applied physics, 76(5), 1994, pp. 2912-2917
Citation: P. Manivannan et A. Subrahmanyam, STUDIES ON THE ELECTRICAL AND OPTICAL-PROPERTIES OF REACTIVE ELECTRON-BEAM EVAPORATED INDIUM TIN OXIDE-FILMS, Journal of physics. D, Applied physics, 26(9), 1993, pp. 1510-1515
Citation: N. Jegadeesh et A. Subrahmanyam, LIQUIDITY EFFECTS OF THE INTRODUCTION OF THE S-AND-P 500 INDEX FUTURES CONTRACT ON THE UNDERLYING STOCKS, The Journal of business, 66(2), 1993, pp. 171-187
Citation: D. Hirshleifer et A. Subrahmanyam, FUTURES VERSUS SHARE CONTRACTING AS MEANS OF DIVERSIFYING OUTPUT RISK, Economic journal, 103(418), 1993, pp. 620-638
Citation: V. Vasu et A. Subrahmanyam, PHOTOVOLTAIC PROPERTIES OF INDIUM TIN OXIDE (ITO) SILICON JUNCTIONS PREPARED BY SPRAY PYROLYSIS DEPENDENCE ON OXIDATION TIME, Semiconductor science and technology, 7(3), 1992, pp. 320-323
Citation: A. Subrahmanyam et N. Balasubramanian, STUDIES OF THE PHOTOVOLTAIC BEHAVIOR OF INDIUM TIN OXIDE (ITO) SILICON JUNCTIONS PREPARED BY THE REACTIVE THERMAL EVAPORATION TECHNIQUE, Semiconductor science and technology, 7(3), 1992, pp. 324-327