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Results: 26-33/33
Authors:
Sasagawa, K
Naito, K
Saka, M
Abe, H
Citation: K. Sasagawa et al., A method to predict electromigration failure of metal lines, J APPL PHYS, 86(11), 1999, pp. 6043-6051
Authors:
Kamiya, S
Sato, M
Saka, M
Abe, H
Citation: S. Kamiya et al., Residual stress distribution in the direction of the film normal in thin diamond films, J APPL PHYS, 86(1), 1999, pp. 224-229
Authors:
Liu, H
Saka, M
Abe, H
Komura, I
Sakamoto, H
Citation: H. Liu et al., Analysis of interaction of multiple cracks in a direct current field and nondestructive evaluation, J APPL MECH, 66(2), 1999, pp. 468-475
Authors:
Takeda, T
Saka, M
Citation: T. Takeda et M. Saka, Electrical conductivity measurement for quantitative evaluation of development speed of a photoresist, J VAC SCI B, 16(6), 1998, pp. 2974-2976
Authors:
Takeda, T
Saka, M
Citation: T. Takeda et M. Saka, Evaluation of development speed of a photoresist by means of electrical conductivity measurement, J VAC SCI B, 16(6), 1998, pp. 3055-3058
Authors:
Sasagawa, K
Nakamura, N
Saka, M
Abe, H
Citation: K. Sasagawa et al., A new approach to calculate atomic flux divergence by electromigration, J ELEC PACK, 120(4), 1998, pp. 360-366
Authors:
Kamiya, S
Takahashi, H
Saka, M
Abe, H
Citation: S. Kamiya et al., Direct measurement of the adhesive fracture resistance of CVD diamond particles, J ELEC PACK, 120(4), 1998, pp. 367-371
Authors:
Saka, M
Iijima, K
Odanaka, Y
Kato, Y
Citation: M. Saka et al., Supercritical fluid extraction of pesticides in fruits and vegetables: Application of new polymer absorbent, J PESTIC S, 23(4), 1998, pp. 414-418