AAAAAA
Results:
1-7
|
Results: 7
Authors:
Kang, M
Matsudo, Y
Sasagawa, K
Tokuhisa, T
Hatano, M
Citation: M. Kang et al., Nd1, a novel murine Kelch family protein, may play the role of a housekeeping gene, BBA-GENE ST, 1519(3), 2001, pp. 167-174
Authors:
Ishida, T
Matsuse, K
Sugita, K
Huang, L
Sasagawa, K
Citation: T. Ishida et al., DC voltage control strategy for a five-level converter, IEEE POW E, 15(3), 2000, pp. 508-515
Authors:
Sasagawa, K
Hasegawa, M
Saka, M
Abe, H
Citation: K. Sasagawa et al., Atomic flux divergence in bamboo line for predicting initial formation of voids and hillocks, THEOR A FR, 33(1), 2000, pp. 67-72
Experimental verification of prediction method for electromigration failure of polycrystalline lines
Authors:
Sasagawa, K
Naito, K
Kimura, H
Saka, M
Abe, H
Citation: K. Sasagawa et al., Experimental verification of prediction method for electromigration failure of polycrystalline lines, J APPL PHYS, 87(6), 2000, pp. 2785-2791
Authors:
Iitsuka, Y
Shimizu, H
Kang, MM
Sasagawa, K
Sekiya, S
Tokuhisa, T
Hatano, M
Citation: Y. Iitsuka et al., An enhancer element for expression of the Ncx (Enx, Hox11L1) gene in neural crest-derived cells, J BIOL CHEM, 274(34), 1999, pp. 24401-24407
Authors:
Sasagawa, K
Naito, K
Saka, M
Abe, H
Citation: K. Sasagawa et al., A method to predict electromigration failure of metal lines, J APPL PHYS, 86(11), 1999, pp. 6043-6051
Authors:
Sasagawa, K
Nakamura, N
Saka, M
Abe, H
Citation: K. Sasagawa et al., A new approach to calculate atomic flux divergence by electromigration, J ELEC PACK, 120(4), 1998, pp. 360-366
Risultati:
1-7
|