Authors:
Morrone, LF
Ettorre, GC
Passavanti, G
Tampoia, M
Schiavone, P
Coratelli, P
Citation: Lf. Morrone et al., Maxillary brown tumor in secondary hyperparathyroidism requiring urgent parathyroidectomy, J NEPHROL, 14(5), 2001, pp. 415-419
Authors:
Amenyah, W
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: W. Amenyah et al., Interior cracking of a circular inclusion with imperfect interface under thermal loading, MATH MECH S, 6(5), 2001, pp. 525-540
Citation: P. Schiavone et al., Rigorous electromagnetic simulation of EUV masks: influence of the absorber properties, MICROEL ENG, 57-8, 2001, pp. 497-503
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Effects of a compliant interphase layer on internal thermal stresses within an elliptic inhomogeneity in an elastic medium, Z ANG MATH, 52(2), 2001, pp. 317-341
Authors:
Sudak, LJ
Ru, CQ
Schiavone, P
Mioduchowski, A
Citation: Lj. Sudak et al., A circular inclusion with circumferentially inhomogeneous non-slip interface in plane elasticity, Q J MECH AP, 54, 2001, pp. 449-468
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Interfacial thermal stress analysis of an elliptic inclusion with a compliant interphase layer in plane elasticity, INT J SOL S, 38(42-43), 2001, pp. 7587-7606
Authors:
Liu, Y
Ru, CQ
Schiavone, P
Mioduchowski, A
Citation: Y. Liu et al., New phenomena concerning the effect of imperfect bonding on radial matrix cracking in fiber composites, INT J ENG S, 39(18), 2001, pp. 2033-2050
Citation: P. Schiavone, Integral solutions of mixed problems in a theory of plane strain elasticity with microstructure, INT J ENG S, 39(10), 2001, pp. 1091-1100
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Analysis of internal stress in an elliptic inclusion with imperfect interface in plane elasticity, MATH MECH S, 5(4), 2000, pp. 501-521
Citation: P. Schiavone et Cq. Ru, The traction problem in a theory of plane strain elasticity with boundary reinforcement, MATH MECH S, 5(1), 2000, pp. 101-115
Citation: A. Schiltz et P. Schiavone, Concept of two-dimensional swing curves for critical dimension prediction and optimization of resist/antireflective coating bilayers in topographic situations, OPT ENG, 39(3), 2000, pp. 776-786
Citation: O. Toublan et al., Determination of the critical dimension and proximity bias variations across the lens field by electrical linewidth measurements, JPN J A P 1, 37(12B), 1998, pp. 6703-6708
Authors:
Trouiller, Y
Buffet, N
Mourier, T
Schiavone, P
Quere, Y
Citation: Y. Trouiller et al., 0.12 mu m optical lithography performances using an alternating deep UV phase shift mask, JPN J A P 1, 37(12B), 1998, pp. 6714-6717