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Citation: G. Perna et al., Luminescence study of the disorder in polycrystalline InP thin films, SEMIC SCI T, 16(5), 2001, pp. 377-385

Authors: Lindstrom, G Ahmed, M Albergo, S Allport, P Anderson, D Andricek, L Angarano, MM Augelli, V Bacchetta, N Bartalini, P Bates, R Biggeri, U Bilei, GM Bisello, D Boemi, D Borchi, E Botila, T Brodbeck, TJ Bruzzi, M Budzynski, T Burger, P Campabadal, F Casse, G Catacchini, E Chilingarov, A Ciampolini, P Cindro, V Costa, MJ Creanza, D Clauws, P Da Via, C Davies, G De Boer, W Dell'Orso, R De Palma, M Dezillie, B Eremin, V Evrard, O Fallica, G Fanourakis, G Feick, H Focardi, E Fonseca, L Fretwurst, E Fuster, J Gabathuler, K Glaser, M Grabiec, P Grigoriev, E Hall, G Hanlon, M Hauler, F Heising, S Holmes-Siedle, A Horisberger, R Hughes, G Huhtinen, M Ilyashenko, I Ivanov, A Jones, BK Jungermann, L Kaminsky, A Kohout, Z Kramberger, G Kuhnke, M Kwan, S Lemeilleur, F Leroy, C Letheren, M Li, Z Ligonzo, T Linhart, V Litovchenko, P Loukas, D Lozano, M Luczynski, Z Lutz, G MacEvoy, B Manolopoulos, S Markou, A Martinez, C Messineo, A Mikuz, M Moll, M Nossarzewska, E Ottaviani, G Oshea, V Parrini, G Passeri, D Petre, D Pickford, A Pintilie, I Pintilie, L Pospisil, S Potenza, R Raine, C Rafi, JM Ratoff, PN Richter, RH Riedler, P Roe, S Roy, P Ruzin, A Ryazanov, AI Santocchia, A Schiavulli, L Sicho, P Siotis, I Sloan, T Slysz, W Smith, K Solanky, M Sopko, B Stolze, K Avset, BS Svensson, B Tivarus, C Tonelli, G Tricomi, A Tzamarias, S Valvo, G Vasilescu, A Vayaki, A Verbitskaya, E Verdini, P Vrba, V Watts, S Weber, ER Wegrzecki, M Wegrzecka, I Weilhammer, P Wheadon, R Wilburn, C Wilhelm, I Wunstorf, R Wustenfeld, J Wyss, J Zankel, K Zabierowski, P Zontar, D

Citation: G. Lindstrom et al., Radiation hard silicon detectors - developments by the RD48 (ROSE) collaboration, NUCL INST A, 466(2), 2001, pp. 308-326

Authors: Lindstrom, G Ahmed, M Albergo, S Allport, P Anderson, D Andricek, L Angarano, MM Augelli, V Bacchetta, N Bartalini, P Bates, R Biggeri, U Bilei, GM Bisello, D Boemi, D Borchi, E Botila, T Brodbeck, TJ Bruzzi, M Budzynski, T Burger, P Campabadal, F Casse, G Catacchini, E Chilingarov, A Ciampolini, P Cindro, V Costa, MJ Creanza, D Clauws, P Da Via, C Davies, G De Boer, W Dell'Orso, R De Palma, M Dezillie, B Eremin, V Evrard, O Fallica, G Fanourakis, G Feick, H Focardi, E Fonseca, L Fretwurst, E Fuster, J Gabathuler, K Glaser, M Grabiec, P Grigoriev, E Hall, G Hanlon, M Hauler, F Heising, S Holmes-Siedle, A Horisberger, R Hughes, G Huhtinen, M Ilyashenko, I Ivanov, A Jones, BK Jungermann, L Kaminsky, A Kohout, Z Kramberger, C Kuhnke, M Kwan, S Lemeilleur, F Leroy, C Letheren, M Li, Z Ligonzo, T Linhart, V Litovchenko, P Loukas, D Lozano, M Luczynski, Z Lutz, G MacEvoy, B Manolopoulos, S Markou, A Martinez, C Messineo, A Miku, M Moll, M Nossarzewska, E Ottaviani, G Oshea, V Parrini, G Passeri, D Petre, D Pickford, A Pintilie, I Pintilie, L Pospisil, S Potenza, R Radicci, V Raine, C Rafi, JM Ratoff, PN Richter, RH Riedler, P Roe, S Roy, P Ruzin, A Ryazanov, AI Santocchia, A Schiavulli, L Sicho, P Siotis, I Sloan, T Slysz, W Smith, K Solanky, M Sopko, B Stolze, K Avset, BS Svensson, B Tivarus, C Tonelli, G Tricomi, A Tzamarias, S Valvo, G Vasilescu, A Vayaki, A Verbitskaya, E Verdini, P Vrba, V Watts, S Weber, ER Wegrzecki, M Wegrzecka, I Weilhammer, P Wheadon, R Wilburn, C Wilhelm, I Wunstorf, R Wustenfeld, J Wyss, J Zankel, K Zabierowski, P Zontar, D

Citation: G. Lindstrom et al., Developments for radiation hard silicon detectors by defect engineering - results by the CERN RD48 (ROSE) Collaboration, NUCL INST A, 465(1), 2001, pp. 60-69

Authors: Ambrico, M Schiavulli, L Ligonzo, T Cicala, G Capezzuto, P Bruno, G

Citation: M. Ambrico et al., Optical absorption and electrical conductivity measurements of microcrystalline silicon layers grown by SiF4/H-2 plasma on glass substrates, THIN SOL FI, 383(1-2), 2001, pp. 200-202

Authors: Augelli, V Ligonzo, T Masellis, MC Muscarella, MF Schiavulli, L Valentini, A

Citation: V. Augelli et al., Electrical properties of gold-polymer composite films, J APPL PHYS, 90(3), 2001, pp. 1362-1367

Authors: Augelli, V Contento, G Ligonzo, T Muscarella, MF Schiavulli, L Angarano, M Creanza, D de Palma, M

Citation: V. Augelli et al., Electrical characterization of standard and oxygenated irradiated ROSE diodes, NUCL INST A, 426(1), 1999, pp. 81-86