ACNP - Italian Periodicals Catalogue

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Results: 1-10 |

Results: 10

Nanoscale calorimetry of isolated polyethylene single crystals

Authors: Kwan, AT Efremov, MY Olson, EA Schiettekatte, F Zhang, M Geil, PH Allen, LH

Citation: At. Kwan et al., Nanoscale calorimetry of isolated polyethylene single crystals, J POL SC PP, 39(11), 2001, pp. 1237-1245

Secondary defects engineering in c-Si: Influence of implantation dose, temperature, and oxygen concentration

Authors: Poirier, R Schiettekatte, F Roorda, S Fortin, MO

Citation: R. Poirier et al., Secondary defects engineering in c-Si: Influence of implantation dose, temperature, and oxygen concentration, J VAC SCI A, 18(2), 2000, pp. 717-719

Dose and implantation temperature influence on extended defects nucleationin c-Si

Authors: Schiettekatte, F Roorda, S Poirier, R Fortin, MO Chazal, S Heliou, R

Citation: F. Schiettekatte et al., Dose and implantation temperature influence on extended defects nucleationin c-Si, NUCL INST B, 164, 2000, pp. 425-430

Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements

Authors: Zhang, M Efremov, MY Schiettekatte, F Olson, EA Kwan, AT Lai, SL Wisleder, T Greene, JE Allen, LH

Citation: M. Zhang et al., Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements, PHYS REV B, 62(15), 2000, pp. 10548-10557

Discrete periodic melting point observations for nanostructure ensembles

Authors: Efremov, MY Schiettekatte, F Zhang, M Olson, EA Kwan, AT Berry, RS Allen, LH

Citation: My. Efremov et al., Discrete periodic melting point observations for nanostructure ensembles, PHYS REV L, 85(17), 2000, pp. 3560-3563

High photoluminescence in erbium-doped chalcogenide thin films

Authors: Fick, J Knystautus, EJ Villeneuve, A Schiettekatte, F Roorda, S Richardson, KA

Citation: J. Fick et al., High photoluminescence in erbium-doped chalcogenide thin films, J NON-CRYST, 272(2-3), 2000, pp. 200-208

Ion-beam modification of Co/Ag multilayers II: Variation of structural andmagnetic properties with Co layer thickness

Authors: Veres, T Cai, M Germain, S Rouabhi, M Schiettekatte, F Roorda, S Cochrane, RW

Citation: T. Veres et al., Ion-beam modification of Co/Ag multilayers II: Variation of structural andmagnetic properties with Co layer thickness, J APPL PHYS, 87(12), 2000, pp. 8513-8521

Direct evidence for 8-interstitial-controlled nucleation of extended defects in c-Si

Authors: Schiettekatte, F Roorda, S Poirier, R Fortin, MO Chazal, S Heliou, R

Citation: F. Schiettekatte et al., Direct evidence for 8-interstitial-controlled nucleation of extended defects in c-Si, APPL PHYS L, 77(26), 2000, pp. 4322-4324

Scanning calorimeter for nanoliter-scale liquid samples

Authors: Olson, EA Efremov, MY Kwan, AT Lai, S Petrova, V Schiettekatte, F Warren, JT Zhang, M Allen, LH

Citation: Ea. Olson et al., Scanning calorimeter for nanoliter-scale liquid samples, APPL PHYS L, 77(17), 2000, pp. 2671-2673

Influence of curvature on impurity gettering by nanocavities in Si

Authors: Schiettekatte, F Wintgens, C Roorda, S

Citation: F. Schiettekatte et al., Influence of curvature on impurity gettering by nanocavities in Si, APPL PHYS L, 74(13), 1999, pp. 1857-1859

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