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Authors: Barak, J Levinson, J Akkerman, A Adler, E Zentner, A David, D Lifshitz, Y Hass, M Fischer, BE Schlogl, M Victoria, M Hajdas, W

Citation: J. Barak et al., Scaling of SEU mapping and cross section, and proton induced SEU at reduced supply voltage, IEEE NUCL S, 46(6), 1999, pp. 1342-1353

Authors: Musseau, O Torres, A Campbell, AB Knudson, AR Buchner, S Fischer, B Schlogl, M Briand, P

Citation: O. Musseau et al., Medium-energy heavy-ion single-event-burnout imaging of power MOSFET's, IEEE NUCL S, 46(6), 1999, pp. 1415-1420

Authors: Mousseau, O Ferlet-Cavrois, V Campbell, AB Knudson, AR Buchner, S Fischer, B Schlogl, M

Citation: O. Mousseau et al., Application of an ion microbeam to determine the radial carrier density inan ion track, NUCL INST B, 146(1-4), 1998, pp. 607-612

Authors: Musseau, O Ferlet-Cavrois, V Campbell, AB Knudson, AR Buchner, S Fischer, B Schlogl, M

Citation: O. Musseau et al., Technique to measure an ion track profile, IEEE NUCL S, 45(6), 1998, pp. 2563-2570