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Results:
1-7
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Results: 7
Authors:
Doerr, AK
Tolan, M
Schlomka, JP
Press, W
Citation: Ak. Doerr et al., Evidence for density anomalies of liquids at the solid/liquid interface, EUROPH LETT, 52(3), 2000, pp. 330-336
Authors:
Kaendler, ID
Seeck, OH
Schlomka, JP
Tolan, M
Press, W
Stettner, J
Kappius, L
Dieker, C
Mantl, S
Citation: Id. Kaendler et al., Structural characterization of oxidized allotaxially grown CoSi2 layers byx-ray scattering, J APPL PHYS, 87(1), 2000, pp. 133-139
Authors:
Schlomka, JP
Tolan, M
Press, W
Citation: Jp. Schlomka et al., In situ growth study of NiMnSb films on MgO(001) and Si(001), APPL PHYS L, 76(15), 2000, pp. 2005-2007
Authors:
Seeck, OH
Hupfeld, D
Krull, H
Doerr, AK
Schlomka, JP
Tolan, M
Press, W
Citation: Oh. Seeck et al., Surface phase transition close to a bulk tricritical point: An x-ray studyof ND4Cl, PHYS REV B, 59(5), 1999, pp. 3474-3479
Authors:
Schwedhelm, R
Schlomka, JP
Woedtke, S
Adelung, R
Kipp, L
Tolan, M
Press, W
Skibowski, M
Citation: R. Schwedhelm et al., Epitaxial thin-film growth of C-60 on VSe2 studied with scanning tunnelingmicroscopy and x-ray diffraction, PHYS REV B, 59(20), 1999, pp. 13394-13400
Authors:
Doerr, AK
Tolan, M
Prange, W
Schlomka, JP
Seydel, T
Press, W
Smilgies, D
Struth, B
Citation: Ak. Doerr et al., Observation of capillary waves on liquid thin films from mesoscopic to atomic length scales, PHYS REV L, 83(17), 1999, pp. 3470-3473
Authors:
Schlomka, JP
Tolan, M
Press, W
Fitzsimmons, MR
Siebrecht, R
Schubert, DW
Simon, P
Citation: Jp. Schlomka et al., Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems, J APPL PHYS, 86(9), 1999, pp. 5146-5151
Risultati:
1-7
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