Authors:
Breymesser, A
Schlosser, V
Peiro, D
Voz, C
Bertomeu, J
Andreu, J
Summhammer, J
Citation: A. Breymesser et al., Kelvin probe measurements of microcrystalline silicon on a nanometer scaleusing SFM, SOL EN MAT, 66(1-4), 2001, pp. 171-177
Authors:
Stoger, M
Nelhiebel, M
Schattschneider, P
Schlosser, V
Breymesser, A
Jouffrey, B
Citation: M. Stoger et al., EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures, SOL EN MAT, 63(2), 2000, pp. 177-184
Authors:
Schlosser, V
Koechli, OR
Cattaneo, R
Jentsch, B
Haller, U
Walt, H
Citation: V. Schlosser et al., Photodynamic effects in vitro in fresh gynecologic tumors analyzed with a bioluminescence method, CLIN CH L M, 37(2), 1999, pp. 115-120
Authors:
Stoger, M
Breymesser, A
Schlosser, V
Ramadori, M
Plunger, V
Peiro, D
Voz, C
Bertomeu, J
Nelhiebel, M
Schattschneider, P
Andreu, J
Citation: M. Stoger et al., Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD, PHYSICA B, 274, 1999, pp. 540-543