Authors: Meier, MM Schott, JU Strauch, K

Citation: Mm. Meier et al., Particle detection properties of charge coupled devices, RADIAT MEAS, 31(1-6), 1999, pp. 173-178

Authors: Meier, MM Schott, JU Strauch, K Groeneveld, KO

Citation: Mm. Meier et al., Detection of delta-electron events in charge coupled devices: a fingerprint of single swift heavy ions, NUCL INST B, 146(1-4), 1998, pp. 601-606