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Results:
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Results: 25
Authors:
Chechenin, NG
van Veen, A
Galindo, RE
Schut, H
Chezan, AR
Bronsveld, PM
de Hosson, JTM
Boerma, DO
Citation: Ng. Chechenin et al., Positron annihilation and transmission electron microscopy study of the evolution of microstructure in cold-rolled and nitrided FeNiTi foils, J PHYS-COND, 13(26), 2001, pp. 5937-5946
Authors:
Stroebe, M
Schut, H
Finkenauer, C
Citation: M. Stroebe et al., The traumatization of grief? A conceptual framework for understanding the trauma-bereavement interface, ISR J PSYCH, 38(3-4), 2001, pp. 185-201
Authors:
Rivera, A
van Veen, A
Schut, H
de Nijs, JMM
Balk, P
Alkemade, PFA
Citation: A. Rivera et al., The behaviour of deuterium incorporated into the buried oxide of SIMOX, NUCL INST B, 178, 2001, pp. 287-290
Authors:
Rivera, A
van Veen, A
Schut, H
de Nijs, JMM
Balk, P
Citation: A. Rivera et al., Interaction of deuterium with SIMOX buried oxide, MICROEL ENG, 59(1-4), 2001, pp. 497-501
Authors:
Hartman, CA
Hox, J
Mellenbergh, GJ
Boyle, MH
Offord, DR
Racine, Y
McNamee, J
Gadow, KD
Sprafkin, J
Kelly, KL
Nolan, EE
Tannock, R
Schachar, R
Schut, H
Postma, I
Drost, R
Sergeant, JA
Citation: Ca. Hartman et al., DSM-IV internal construct validity: When a taxonomy meets data, J CHILD PSY, 42(6), 2001, pp. 817-836
Authors:
Mohsen, M
Gomaa, EAH
Schut, H
Van Veen, A
Citation: M. Mohsen et al., Positron annihilation lifetime studies of gas sorption and desorption in polyethylene and poly[1-(trimethylsilyl)-1-propyne], J APPL POLY, 80(7), 2001, pp. 970-974
Authors:
Kruseman, AC
van Veen, A
Schut, H
Mijnarends, PE
Fujinami, M
Citation: Ac. Kruseman et al., Buried oxide and defects in oxygen implanted Si monitored by positron annihilation, J APPL PHYS, 90(3), 2001, pp. 1179-1187
Authors:
Galindo, RE
Van Veen, A
Garcia, AA
Schut, H
De Hosson, JTM
Citation: Re. Galindo et al., Study of polymer/metal coating under stress using positron annihilation spectroscopy, ACT MATER, 48(18-19), 2000, pp. 4743-4747
Authors:
Shiryaev, AA
van Veen, A
Schut, H
Kruseman, AC
Zakharchenko, OD
Citation: Aa. Shiryaev et al., Positron beam investigations of natural cubic and coated diamonds, RADIAT PH C, 58(5-6), 2000, pp. 625-632
Authors:
Schut, H
Escobar, GR
Kolar, ZI
van Veen, A
Clet, G
Citation: H. Schut et al., Positronium formation in NaY-zeolites studied by lifetime, positron beam Doppler broadening and 3-gamma detection techniques, RADIAT PH C, 58(5-6), 2000, pp. 715-718
Authors:
Rivera, A
de Nijs, JMM
Balk, P
van Veen, A
Schut, H
Alkemade, PFA
Citation: A. Rivera et al., Oxygen-related defects in the top silicon layer of SIMOX; the effect of thermal treatments, MAT SCI E B, 73(1-3), 2000, pp. 77-81
Authors:
Stroebe, M
van Son, M
Stroebe, W
Kleber, R
Schut, H
van den Bout, J
Citation: M. Stroebe et al., On the classification and diagnosis of pathological grief, CLIN PSYCH, 20(1), 2000, pp. 57-75
Authors:
Fedorov, AV
van Huis, MA
van Veen, A
Schut, H
Citation: Av. Fedorov et al., Formation of gold nanoclusters in MgO by ion implantation at elevated temperatures, NUCL INST B, 166, 2000, pp. 215-219
Authors:
Kooi, BJ
van Veen, A
De Hosson, JTM
Schut, H
Fedorov, AV
Labohm, F
Citation: Bj. Kooi et al., Rectangular nanovoids in helium-implanted and thermally annealed MgO(100), APPL PHYS L, 76(9), 2000, pp. 1110-1112
Authors:
Van Veen, A
Schut, H
Mijnarends, PE
Citation: A. Van Veen et al., Depth-profiling of subsurface regions, interfaces and thin films, POSITRON BEAMS AND THEIR APPLICATIONS, 2000, pp. 191-225
Authors:
Inia, DK
Vredenberg, AM
Boerma, DO
Tichelaar, FD
Schut, H
van Veen, A
Citation: Dk. Inia et al., Microstructural investigation of iron nitride layers formed by low-temperature gaseous nitriding, J MATER RES, 14(6), 1999, pp. 2674-2679
Authors:
Stroebe, M
Schut, H
Citation: M. Stroebe et H. Schut, The dual process model of coping with bereavement: Rationale and description, DEATH STUD, 23(3), 1999, pp. 197-224
Authors:
Jorgensen, LV
van Veen, A
Schut, H
Winkelman, A
Kruit, P
Citation: Lv. Jorgensen et al., A testing set-up for a micro-analysis positron beam facility, NUCL INST A, 427(1-2), 1999, pp. 131-135
Authors:
van Veen, A
Schut, H
Labohm, F
de Roode, J
Citation: A. Van Veen et al., Positron extraction and transport in a nuclear-reactor-based positron beam, NUCL INST A, 427(1-2), 1999, pp. 266-270
Authors:
Fedorov, AV
van Veen, A
Schut, H
Rivera, A
Citation: Av. Fedorov et al., Removal of vacancy type clusters by low energy ion generated self-interstitials in crystalline silicon, NUCL INST B, 148(1-4), 1999, pp. 289-293
Authors:
Kruseman, AC
Schut, H
van Veen, A
Fujinami, M
Citation: Ac. Kruseman et al., Oxygen implanted silicon investigated by positron annihilation spectroscopy, NUCL INST B, 148(1-4), 1999, pp. 294-299
Authors:
van Veen, A
Schut, H
Fedorov, AV
Labohm, F
Neeft, EAC
Konings, RJM
Citation: A. Van Veen et al., The formation of microvoids in MgO by helium ion implantation and thermal annealing, NUCL INST B, 148(1-4), 1999, pp. 768-772
Authors:
Schut, H
Van Veen, A
Labohm, F
Fedorov, AV
Neeft, EAC
Konings, RJM
Citation: H. Schut et al., Annealing behaviour of defects in helium implanted MgO, NUCL INST B, 147(1-4), 1999, pp. 212-215
Authors:
van Veen, A
Schut, H
Fedorov, AV
Neeft, EAC
Konings, RJM
Kooi, BJ
de Hosson, JTM
Citation: A. Van Veen et al., Hydrogen implantation defects in MgO, NUCL INST B, 147(1-4), 1999, pp. 216-220
Authors:
Mijnarends, PE
Kruseman, AC
van Veen, A
Schut, H
Bansil, A
Citation: Pe. Mijnarends et al., Two-detector Doppler broadening study of enhancement in Al, J PHYS-COND, 10(46), 1998, pp. 10383-10390
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