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Results:
1-11
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Results: 11
Authors:
Ogura, Y
Kondo, M
Morimoto, T
Notomi, A
Sekigawa, T
Citation: Y. Ogura et al., Oxygen permeability of Y2SiO5, MATER TRANS, 42(6), 2001, pp. 1124-1130
Authors:
Sekigawa, T
Oguir, K
Kochiyama, J
Miho, K
Citation: T. Sekigawa et al., Endurance test of oxidation-resistant CVD-SIC coating on C/C composites for space vehicle, MATER TRANS, 42(5), 2001, pp. 825-828
Authors:
Oguri, K
Sekigawa, T
Kochiyama, J
Miho, K
Citation: K. Oguri et al., Catalycity measurement of oxidation-resistant CVD-SiC coating on C/C composite for space vehicle, MATER TRANS, 42(5), 2001, pp. 856-861
Authors:
Ogura, Y
Kondo, M
Morimoto, T
Notomi, A
Sekigawa, T
Citation: Y. Ogura et al., Vaporization behavior of plasma sprayed Y2SiO5 coatings, J JPN METAL, 65(1), 2001, pp. 6-12
Authors:
Yamanaka, M
Sakata, I
Sekigawa, T
Citation: M. Yamanaka et al., Effects of film quality of hydrogenated amorphous silicon grown by thermalchemical-vapor-depositon on subsequent in-situ hydrogenation processes, JPN J A P 1, 39(6A), 2000, pp. 3302-3307
Authors:
Suzuki, E
Ishii, K
Kanemaru, S
Maeda, T
Tsutsumi, T
Sekigawa, T
Nagai, K
Hiroshima, H
Citation: E. Suzuki et al., Highly suppressed short-channel effects in ultrathin SOI n-MOSFET's, IEEE DEVICE, 47(2), 2000, pp. 354-359
Authors:
Ishida, Y
Takahashi, T
Okumura, H
Sekigawa, T
Yoshida, S
Citation: Y. Ishida et al., Elongated shaped Si island formation on 3C-SiC by chemical vapor deposition and its application to antiphase domain observation, JPN J A P 1, 38(6A), 1999, pp. 3470-3474
Authors:
Fukuda, K
Nagai, K
Sekigawa, T
Yoshida, S
Arai, K
Yoshikawa, M
Citation: K. Fukuda et al., Improvement of SiO2/4H-SiC interface using high-temperature hydrogen annealing at low pressure and vacuum annealing, JPN J A P 1, 38(4B), 1999, pp. 2306-2309
Authors:
Ishii, K
Suzuki, E
Kanemaru, S
Maeda, T
Tsutsumi, T
Nagai, K
Sekigawa, T
Hiroshima, H
Citation: K. Ishii et al., Fabrication of 40-150 nm gate length ultrathin n-MOSFETs using epitaxial layer transfer SOI wafers, JPN J A P 1, 38(4B), 1999, pp. 2492-2495
Authors:
Suzuki, M
Maezawa, M
Takato, H
Nakagawa, H
Hirayama, F
Kiryu, S
Aoyagi, M
Sekigawa, T
Shoji, A
Citation: M. Suzuki et al., An interface circuit for a Josephson-CMOS hybrid digital system, IEEE APPL S, 9(2), 1999, pp. 3314-3317
Authors:
Sakakibara, N
Notomi, A
Ogura, Y
Kondo, M
Fujiwara, C
Sekigawa, T
Kouchiyama, J
Miho, K
Citation: N. Sakakibara et al., Y2SiO5 high temperature oxidation resistant coating on C/C composites by plasma spraying, J JPN METAL, 63(1), 1999, pp. 118-125
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