Authors: Furbock, C Pogany, D Litzenberger, M Gornik, E Seliger, N Gossner, H Muller-Lynch, T Stecher, M Werner, W

Citation: C. Furbock et al., Interferometric temperature mapping during ESD stress and failure analysisof smart power technology ESD protection devices, J ELECTROST, 49(3-4), 2000, pp. 195-213

Authors: Ramminger, S Seliger, N Wachutka, G

Citation: S. Ramminger et al., Reliability model for Al wire bonds subjected to heel crack failures, MICROEL REL, 40(8-10), 2000, pp. 1521-1525

Authors: Furbock, C Litzenberger, M Pogany, D Gornik, E Seliger, N Muller-Lynch, T Stecher, M Gossner, H Werner, W

Citation: C. Furbock et al., Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress, MICROEL REL, 39(6-7), 1999, pp. 925-930

Authors: Pogany, D Seliger, N Litzenberger, M Gossner, H Stecher, M Muller-Lynch, T Werner, W Gornik, E

Citation: D. Pogany et al., Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices, MICROEL REL, 39(6-7), 1999, pp. 1143-1148