Authors:
Semouchkina, E
Cao, WW
Lanagan, M
Mittra, R
Yu, WH
Citation: E. Semouchkina et al., Combining FDTD simulations with measurements of microstrip ring resonatorsfor characterization of low- and HIGH-K dielectrics at microwaves, MICROW OPT, 29(1), 2001, pp. 21-24
Authors:
Semouchkina, E
Cao, WW
Mittra, R
Lanagan, M
Citation: E. Semouchkina et al., Numerical modeling and experimental investigation of resonance properties of microwave capacitors, MICROW OPT, 29(1), 2001, pp. 54-60
Citation: E. Semouchkina et al., Analysis of resonance processes in microstrip ring resonators by the FDTD method, MICROW OPT, 28(5), 2001, pp. 312-321
Citation: E. Semouchkina et al., Efficient determination of resonance frequencies in resonant structures using the FDTD method, MICROW OPT, 28(4), 2001, pp. 244-247
Citation: E. Semouchkina et al., Modeling of microwave ring resonators using the finite-difference time-domain method (FDTD), MICROW OPT, 24(6), 2000, pp. 392-396
Citation: E. Semouchkina et al., High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators, ELECTR LETT, 36(11), 2000, pp. 956-958
Citation: E. Semouchkina et al., Source excitation methods for the finite-difference time-domain modeling of circuits and devices, MICROW OPT, 21(2), 1999, pp. 93-100