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Authors:
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Citation: Jp. Araujo et al., Stability and diffusion of Hg implanted YBa2Cu3O6+x, NUCL INST B, 148(1-4), 1999, pp. 807-812
Authors:
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Marques, JG
Alves, E
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von Papen, T
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Melo, AA
da Silva, MF
Soares, JC
Sousa, JB
Citation: Jp. Araujo et al., Stability studies of Hg implanted YBa2Cu3O6+x, NUCL INST B, 147(1-4), 1999, pp. 244-248
Authors:
Mooney, MB
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Citation: Mb. Mooney et al., Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source., MICROEL ENG, 48(1-4), 1999, pp. 283-286
Authors:
Casaca, A
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Dubourdieu, C
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Citation: A. Casaca et al., Magnetoresistance and Hall effect in unidirectionally twinned YBa2Cu3O7-delta thin films, PHYS REV B, 59(2), 1999, pp. 1538-1545
Citation: S. Pignard et al., Epitaxial and polycrystalline BaFe12O19 thin films grown by chemical vapour deposition, THIN SOL FI, 350(1-2), 1999, pp. 119-123
Authors:
Dubourdieu, C
Audier, M
Senateur, JP
Pierre, J
Citation: C. Dubourdieu et al., Effects of the microstructure on the magnetotransport properties of polycrystalline manganite films grown by metalorganic chemical vapor deposition, J APPL PHYS, 86(12), 1999, pp. 6945-6955