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Results: 1-9 |
Results: 9
Optical and electrical properties of C60Tex films
Authors: Makarova, TL Melekhin, VG Serenkov, IT Sakharov, VI Zakharova, IB Gasumyants, VE
Citation: Tl. Makarova et al., Optical and electrical properties of C60Tex films, PHYS SOL ST, 43(7), 2001, pp. 1393-1399
Growth of ultrathin YBa2Cu3O7-x films on the SrTiO3 substrate
Authors: Gol'man, EK Il'in, RN Plotkin, DA Razumov, SV Sakharov, VI Serenkov, IT
Citation: Ek. Gol'Man et al., Growth of ultrathin YBa2Cu3O7-x films on the SrTiO3 substrate, PHYS SOL ST, 42(3), 2000, pp. 406-408
Dependence of the microwave surface resistance on the structure and thickness of superconducting cuprate films
Authors: Karmanenko, SF Svishchev, AA Semenov, AA Serenkov, IT Sakharov, VI Nashchekin, AV
Citation: Sf. Karmanenko et al., Dependence of the microwave surface resistance on the structure and thickness of superconducting cuprate films, TECH PHYS L, 25(8), 1999, pp. 626-629
Component composition and strain of barium-strontium titanate ferroelectric films
Authors: Karmanenko, SF Dedyk, AI Isakov, NN Sakharov, VI Semenov, AA Serenkov, IT Ter-Martirosyan, LT
Citation: Sf. Karmanenko et al., Component composition and strain of barium-strontium titanate ferroelectric films, TECH PHYS L, 25(10), 1999, pp. 780-783
Study of YBa2Cu3O7-x films at various stages of their growth by medium-energy ion scattering
Authors: Afrosimov, VV Il'in, RN Sakharov, VI Serenkov, IT Yanovskii, DV Karmanenko, SF Semenov, AA
Citation: Vv. Afrosimov et al., Study of YBa2Cu3O7-x films at various stages of their growth by medium-energy ion scattering, PHYS SOL ST, 41(4), 1999, pp. 527-533
Light-induced transformation of C-60 films in the presence and absence of oxygen
Authors: Makarova, TL Sakharov, VI Serenkov, IT Vul', AY
Citation: Tl. Makarova et al., Light-induced transformation of C-60 films in the presence and absence of oxygen, PHYS SOL ST, 41(3), 1999, pp. 497-500
Redistribution of erbium during the crystallization of buried amorphous silicon layers
Authors: Aleksandrov, OV Nikolaev, YA Sobolev, NA Sakharov, VI Serenkov, IT Kudryavtsev, YA
Citation: Ov. Aleksandrov et al., Redistribution of erbium during the crystallization of buried amorphous silicon layers, SEMICONDUCT, 33(6), 1999, pp. 606-609
Effect of annealing on the optical and structural properties of GaN : Er
Authors: Sobolev, NA Lundin, VV Sakharov, VI Serenkov, IT Usikov, AS Emel'yanov, AM
Citation: Na. Sobolev et al., Effect of annealing on the optical and structural properties of GaN : Er, SEMICONDUCT, 33(6), 1999, pp. 624-626
Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors
Authors: Dedyk, AI Karmanenko, SF Leppavuori, S Sakharov, VI Semenov, AA Serenkov, IT Ter-Martirosyan, LT Uusimaki, A Wang, F
Citation: Ai. Dedyk et al., Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors, J PHYS IV, 8(P9), 1998, pp. 217-220
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