Citation: Wr. Zhang et al., Rapid evaluation degradation activation energy of n-GaAs ohmic contacts with and without TiN diffusion barrier layers, SOL ST ELEC, 45(7), 2001, pp. 1183-1187
Authors:
Guo, X
Shen, GD
Wang, GH
Zhu, WJ
Du, JY
Gao, G
Zou, DS
Chen, YH
Ma, XY
Chen, LH
Citation: X. Guo et al., Tunnel-regenerated multiple-active-region light-emitting diodes with high efficiency, APPL PHYS L, 79(18), 2001, pp. 2985-2986
Authors:
Lian, P
Yin, T
Gao, G
Zou, DS
Chen, CH
Li, JJ
Shen, GD
Ma, XY
Chen, LH
Citation: P. Lian et al., Novel coupled multi-active region high power semiconductor lasers cascadedvia tunnel junction, ACT PHY C E, 49(12), 2000, pp. 2374-2377
Citation: Jj. Li et al., The RPS method applied to the numerical solution of multimode slab waveguides with complex indexes, J LIGHTW T, 18(10), 2000, pp. 1433-1436