Citation: Wc. Liu et al., Temperature-dependent investigation of a high-breakdown voltage and low-leakage current Ga0.51In0.49/In0.15Ga0.85As pseudomorphic HEMT, IEEE ELEC D, 20(6), 1999, pp. 274-276
Citation: Wl. Chang et al., On the n(+)-GaAs/delta(p(+))-GaInP/n-GaAs high breakdown voltage field-effect transistor, SEMIC SCI T, 14(4), 1999, pp. 307-311
Citation: Yh. Shie et al., On the low-medium-high step-modulation-doped-channel (LMH-SMDC) heterostructure field-effect transistor, MATER CH PH, 57(3), 1999, pp. 268-272
Citation: Sy. Cheng et al., Design consideration of emitter-base junction structure for InGaP/GaAs heterojunction bipolar transistors, SOL ST ELEC, 43(2), 1999, pp. 297-304
Citation: Ws. Lour et al., Application of selective removal of mesa sidewalls for high-breakdown and high-linearity Ga0.51In0.49P/In0.15Ga0.85 As pseudomorphic transistors, APPL PHYS L, 74(15), 1999, pp. 2155-2157