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Results:
1-22
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Results: 22
Authors:
O'Neill-Carrillo, E
Banfai, B
Heydt, GT
Si, J
Citation: E. O'Neill-carrillo et al., EMTP implementation and analysis of nonlinear load models, EL POW CO S, 29(9), 2001, pp. 809-820
Authors:
Si, J
Wang, YT
Citation: J. Si et Yt. Wang, On-line learning control by association and reinforcement, IEEE NEURAL, 12(2), 2001, pp. 264-276
Authors:
Liang, XB
Si, J
Citation: Xb. Liang et J. Si, Global exponential stability of neural networks with globally Lipschitz continuous activations and its application to linear variational inequality problem, IEEE NEURAL, 12(2), 2001, pp. 349-359
Authors:
He, Q
Si, J
Tylavsky, DJ
Citation: Q. He et al., Closure to discussion of "Prediction of top-oil temperature for transformers using neural networks", IEEE POW D, 16(4), 2001, pp. 826-826
Authors:
Si, J
Fritts, CA
Burnham, DJ
Waldroup, PW
Citation: J. Si et al., Relationship of dietary lysine level to the concentration of all essentialamino acids in broiler diets, POULTRY SCI, 80(10), 2001, pp. 1472-1479
Authors:
Hirao, K
Mitsuyu, T
Si, J
Qui, J
Citation: K. Hirao et al., Active glass for photonic devices - Photoinduced structures and their application, SP S PHOTON, 7, 2001, pp. 1-229
Authors:
Fritts, CA
Kersey, JH
Motl, MA
Kroger, EC
Yan, F
Si, J
Jiang, Q
Campos, MM
Waldroup, AL
Waldroup, PW
Citation: Ca. Fritts et al., Bacillus subtilis C-3102 (Calsporin) improves live performance and microbiological status of broiler chickens, J APPL POUL, 9(2), 2000, pp. 149-155
Authors:
Liu, X
Xu, G
Si, J
Ye, P
Li, Z
Shen, Y
Citation: X. Liu et al., Erasure effect of the reading beam on the decay process of chi((2)) in all-optical poling, APP PHYS B, 71(4), 2000, pp. 539-543
Authors:
Guo, Z
Li, Y
Ge, Z
Yan, J
Zhu, D
Si, J
Ye, P
Citation: Z. Guo et al., Langmuir-Blodgett films and optical second-harmonic generation of a crowned [60]fulleropyrrolidine, APP PHYS B, 71(4), 2000, pp. 545-548
Authors:
Guo, Z
Li, Y
Yan, J
Bai, F
Li, F
Zhu, D
Si, J
Ye, P
Citation: Z. Guo et al., Photophysical properties of a crown ether-bearing [60]fulleropyrrolidine, APP PHYS B, 70(2), 2000, pp. 257-260
Authors:
Si, J
Lin, S
Vuong, MA
Citation: J. Si et al., Dynamic topology representing networks, NEURAL NETW, 13(6), 2000, pp. 617-627
Authors:
Zhou, G
Si, J
Taft, CW
Citation: G. Zhou et al., Modeling and simulation of C-E deep bowl pulverizer, IEEE EN CON, 15(3), 2000, pp. 312-322
Authors:
Tylavsky, DJ
He, Q
Si, J
McCulla, GA
Hunt, JR
Citation: Dj. Tylavsky et al., Transformer top-oil temperature modeling and simulation, IEEE IND AP, 36(5), 2000, pp. 1219-1225
Authors:
Qiu, JR
Kazanski, PG
Si, J
Miura, K
Mitsuyu, T
Hirao, K
Gaeta, AL
Citation: Jr. Qiu et al., Memorized polarization-dependent light scattering in rare-earth-ion-doped glass, APPL PHYS L, 77(13), 2000, pp. 1940-1942
Authors:
Kitaoka, K
Matsuoka, N
Si, J
Mitsuyu, T
Hirao, K
Citation: K. Kitaoka et al., Optical poling of phenyl-silica hybrid thin films doped with azo-dye chromophore, JPN J A P 2, 38(9AB), 1999, pp. L1029-L1031
Authors:
Xu, G
Liu, X
Si, J
Ye, P
Li, Z
Shen, Y
Citation: G. Xu et al., Optical poling in a crosslinkable polymer system, APP PHYS B, 68(4), 1999, pp. 693-696
Authors:
Kitaoka, K
Si, J
Mitsuyu, T
Hirao, K
Citation: K. Kitaoka et al., Optical-poling of an azo-dye chromophore doped silica hybrid thin films, J CERAM S J, 107(6), 1999, pp. 522-526
Authors:
Limanond, S
Si, J
Tseng, YL
Citation: S. Limanond et al., Production data based optimal etch time control design for a reactive ion etching process, IEEE SEMIC, 12(1), 1999, pp. 139-147
Authors:
Zhou, C
Si, J
Citation: C. Zhou et J. Si, Subset-based training and pruning of sigmoid neural networks, NEURAL NETW, 12(1), 1999, pp. 79-89
Authors:
Zhu, D
Guo, Z
Li, Y
Bai, F
Li, F
Si, J
Ye, P
Citation: D. Zhu et al., Photophysical properties of a novel crowned [60]fulleropyrrolidine, SYNTH METAL, 102(1-3), 1999, pp. 1496-1497
Authors:
Kitaoka, K
Si, J
Mitsuyu, T
Hirao, K
Citation: K. Kitaoka et al., Optical poling of azo-dye-doped thin films using an ultrashort pulse laser, APPL PHYS L, 75(2), 1999, pp. 157-159
Authors:
Limanond, S
Si, J
Tsakalis, K
Citation: S. Limanond et al., Monitoring and control of semiconductor manufacturing processes, IEEE CONT S, 18(6), 1998, pp. 46-58
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