Authors:
Sigmund, J
Saglam, M
Vogt, A
Hartnagel, HL
Buschmann, V
Wieder, T
Fuess, H
Citation: J. Sigmund et al., Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of sub-micron contacts, J CRYST GR, 227, 2001, pp. 625-629