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Results:
1-13
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Results: 13
Authors:
Sigle, W
Ruhle, M
Silcox, J
Citation: W. Sigle et al., ISSM 2000 - Proceedings of the International Symposium on Spectroscopy of Materials - Rottach-Egern, Germany, March 6-10, 2000 - Preface, ULTRAMICROS, 86(3-4), 2001, pp. NIL_5-NIL_5
Authors:
Muller, DA
Edwards, B
Kirkland, EJ
Silcox, J
Citation: Da. Muller et al., Simulation of thermal diffuse scattering including a detailed phonon dispersion curve, ULTRAMICROS, 86(3-4), 2001, pp. 371-380
Authors:
Plisch, MJ
Chang, JL
Silcox, J
Buhrman, RA
Citation: Mj. Plisch et al., Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy, APPL PHYS L, 79(3), 2001, pp. 391-393
Authors:
Verbeeck, J
Lebedev, OI
Van Tendeloo, G
Silcox, J
Mercey, B
Hervieu, M
Haghiri-Gosnet, AM
Citation: J. Verbeeck et al., Electron energy-loss spectroscopy study of a (LaMnO3)(8)(SrMnO3)(4) heterostructure, APPL PHYS L, 79(13), 2001, pp. 2037-2039
Authors:
Eustis, TJ
Silcox, J
Murphy, MJ
Schaff, WJ
Citation: Tj. Eustis et al., Evidence from EELS of oxygen in the nucleation layer of a MBE grown III-NHEMT, MRS I J N S, 5, 2000, pp. NIL_167-NIL_172
Authors:
Lee, JL
Silcox, J
Citation: Jl. Lee et J. Silcox, Annular dark-field image simulation of the YBa2Cu3O7-delta/BaF2 interface, ULTRAMICROS, 84(1-2), 2000, pp. 65-74
Authors:
Jiang, N
Silcox, J
Citation: N. Jiang et J. Silcox, Observations of reaction zones at chromium/oxide glass interfaces, J APPL PHYS, 87(8), 2000, pp. 3768-3776
Authors:
Jiang, N
Qiu, JR
Silcox, J
Citation: N. Jiang et al., Precipitation of nanometer scale Zn crystalline particles in ZnO-B2O3-SiO2glass during electron irradiation, APPL PHYS L, 77(24), 2000, pp. 3956-3958
Authors:
Vanfleet, RR
Shverdin, M
Silcox, J
Zhu, ZH
Lo, YH
Citation: Rr. Vanfleet et al., Interface structures in GaAs wafer bonding: Application to compliant substrates, APPL PHYS L, 76(19), 2000, pp. 2674-2676
Authors:
Lee, JL
Weiss, CA
Buhrman, RA
Silcox, J
Citation: Jl. Lee et al., Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O7-delta/BaF2 interface, MICRON, 30(5), 1999, pp. 437-447
Authors:
Reed, BW
Chen, JM
MacDonald, NC
Silcox, J
Bertsch, GF
Citation: Bw. Reed et al., Fabrication and STEM/EELS measurements of nanometer-scale silicon tips andfilaments, PHYS REV B, 60(8), 1999, pp. 5641-5652
Authors:
Murphy, MJ
Chu, K
Wu, H
Yeo, W
Schaff, WJ
Ambacher, O
Eastman, LF
Eustis, TJ
Silcox, J
Dimitrov, R
Stutzmann, M
Citation: Mj. Murphy et al., High-frequency AlGaN/GaN polarization-induced high electron mobility transistors grown by plasma-assisted molecular-beam epitaxy, APPL PHYS L, 75(23), 1999, pp. 3653-3655
Authors:
Deshmukh, MM
Ralph, DC
Thomas, M
Silcox, J
Citation: Mm. Deshmukh et al., Nanofabrication using a stencil mask, APPL PHYS L, 75(11), 1999, pp. 1631-1633
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