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Results: 1-3 |
Results: 3
Inversion charge modeling
Authors: Gummel, HK Singhal, K
Citation: Hk. Gummel et K. Singhal, Inversion charge modeling, IEEE DEVICE, 48(8), 2001, pp. 1585-1593
Intrinsic MOSFET capacitance coefficients
Authors: Gummel, HK Singhal, K
Citation: Hk. Gummel et K. Singhal, Intrinsic MOSFET capacitance coefficients, IEEE DEVICE, 48(10), 2001, pp. 2384-2393
Statistical device models from worst case files and electrical test data
Authors: Singhal, K Visvanathan, V
Citation: K. Singhal et V. Visvanathan, Statistical device models from worst case files and electrical test data, IEEE SEMIC, 12(4), 1999, pp. 470-484
Risultati: 1-3 |