Authors: Jurczyk, J Sitko, R Zawisza, B

Citation: J. Jurczyk et al., XRF analysis of powder microsamples of multielement mono- and polycrystals. Determination of Cr, Mn, Ni, Cu, Zn, Ga, As, Se, Sb, Yb, CHEM ANAL, 45(3), 2000, pp. 415-428

Authors: Jurczyk, J Sitko, R Zawisza, B Buhl, F Malicka, E

Citation: J. Jurczyk et al., XRF analysis of microsamples of semiconductor type multielement materials by the thin layer method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb, MIKROCH ACT, 132(1), 1999, pp. 41-47

Authors: Sitko, R Jurczyk, J

Citation: R. Sitko et J. Jurczyk, A method for the determination of mass per unit area inhomogeneity of thinsamples in XRF analysis, CHEM ANAL, 44(6), 1999, pp. 1033-1040

Authors: Jurczyk, J Sitko, R Buhl, F Jendrzejewska, I

Citation: J. Jurczyk et al., Thin sample in the XRF analysis. A new method of preparing microsamples ofmono- and polycrystals and of silicate rocks, CHEM ANAL, 44(2), 1999, pp. 167-186