Authors:
Slotte, J
Laakso, A
Ahlgren, T
Rauhala, E
Salonen, R
Raisanen, J
Simon, A
Uzonyi, I
Kiss, AZ
Somorjai, E
Citation: J. Slotte et al., Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry, J APPL PHYS, 87(1), 2000, pp. 140-143