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Results: 1-14 |
Results: 14
Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers
Authors: Basnar, B Golka, S Gornik, E Harasek, S Bertagnolli, E Schatzmayr, M Smoliner, J
Citation: B. Basnar et al., Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers, J VAC SCI B, 19(5), 2001, pp. 1808-1812
Enhanced k(parallel to) filtering effects in ballistic electron emission experiments - art. no. 205306
Authors: Strahberger, C Smoliner, J Heer, R Strasser, G
Citation: C. Strahberger et al., Enhanced k(parallel to) filtering effects in ballistic electron emission experiments - art. no. 205306, PHYS REV B, 6320(20), 2001, pp. 5306
A reliable course of scanning capacitance microscopy analysis applied for 2D-dopant profilings of power MOSFET devices
Authors: Leicht, M Fritzer, G Basnar, B Golka, S Smoliner, J
Citation: M. Leicht et al., A reliable course of scanning capacitance microscopy analysis applied for 2D-dopant profilings of power MOSFET devices, MICROEL REL, 41(9-10), 2001, pp. 1535-1537
Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images
Authors: Smoliner, J Basnar, B Golka, S Gornik, E Loffler, B Schatzmayr, M Enichlmair, H
Citation: J. Smoliner et al., Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images, APPL PHYS L, 79(19), 2001, pp. 3182-3184
Ballistic transport through GaAs-AlGaAs superlattices in transverse magnetic fields
Authors: Rakoczy, D Smoliner, J Heer, R Strasser, G
Citation: D. Rakoczy et al., Ballistic transport through GaAs-AlGaAs superlattices in transverse magnetic fields, J APPL PHYS, 88(6), 2000, pp. 3495-3500
k(parallel to)=0 filtering effects in ballistic electron transport throughsub-surface resonant tunneling diodes
Authors: Heer, R Smoliner, J Strasser, G
Citation: R. Heer et al., k(parallel to)=0 filtering effects in ballistic electron transport throughsub-surface resonant tunneling diodes, PHYSICA B, 272(1-4), 1999, pp. 187-189
Ballistic Electron Emission Microscopy on buried GaAs-AlGaAs superlattices
Authors: Smoliner, J Heer, R Strasser, G
Citation: J. Smoliner et al., Ballistic Electron Emission Microscopy on buried GaAs-AlGaAs superlattices, MICROEL ENG, 47(1-4), 1999, pp. 69-71
k(parallel to)=0 filtering in resonant-tunneling processes between materials of different effective electron mass
Authors: Smoliner, J Heer, R Strasser, G
Citation: J. Smoliner et al., k(parallel to)=0 filtering in resonant-tunneling processes between materials of different effective electron mass, PHYS REV B, 60(8), 1999, pp. R5137-R5140
Temperature-dependent studies of InAs base layers for ballistic electron emission microscopy
Authors: Heer, R Smoliner, J Strasser, G Gornik, E
Citation: R. Heer et al., Temperature-dependent studies of InAs base layers for ballistic electron emission microscopy, PHYS REV B, 59(7), 1999, pp. 4618-4621
Highly transmittive semiconductor base for ballistic electron emission microscopy
Authors: Heer, R Smoliner, J Strasser, G Gornik, E
Citation: R. Heer et al., Highly transmittive semiconductor base for ballistic electron emission microscopy, SURF INT AN, 27(5-6), 1999, pp. 517-520
Biased GaAs AlGaAs superlattices employed as energy filter for ballistic electron emission microscopy
Authors: Smoliner, J Heer, R Strasser, G
Citation: J. Smoliner et al., Biased GaAs AlGaAs superlattices employed as energy filter for ballistic electron emission microscopy, SURF INT AN, 27(5-6), 1999, pp. 542-546
Metal-insulator-metal injector for ballistic electron emission spectroscopy
Authors: Heer, R Rakoczy, D Ploner, G Strasser, G Gornik, E Smoliner, J
Citation: R. Heer et al., Metal-insulator-metal injector for ballistic electron emission spectroscopy, APPL PHYS L, 75(25), 1999, pp. 4007-4009
A device layout for tunneling spectroscopy of barrier-separated electron systems with tunable dimensionality
Authors: Ploner, G Hirner, H Maier, T Strasser, G Smoliner, J Gornik, E
Citation: G. Ploner et al., A device layout for tunneling spectroscopy of barrier-separated electron systems with tunable dimensionality, APPL PHYS L, 74(12), 1999, pp. 1758-1760
A highly transmittive semiconductor base for ballistic electron emission microscopy
Authors: Heer, R Smoliner, J Strasser, G Gornik, E
Citation: R. Heer et al., A highly transmittive semiconductor base for ballistic electron emission microscopy, APPL PHYS L, 73(9), 1998, pp. 1218-1220
Risultati: 1-14 |