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Results: 1-12 |
Results: 12
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
Authors: Sokolowski-Tinten, K von Hoegen, MH von der Linde, D Cavalleri, A Siders, CW Brown, FLH Leitner, DM Toth, C Squier, JA Bart, CPJ Wilson, KR Kammler, M
Citation: K. Sokolowski-tinten et al., Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction, J PHYS IV, 11(PR2), 2001, pp. 473-477
Set-up for ultrafast time-resolved X-ray diffraction using a femtosecond laser-plasma keV X-ray source
Authors: Blome, C Sokolowski-Tinten, K Dietrich, C Tarasevitch, A von der Linde, D
Citation: C. Blome et al., Set-up for ultrafast time-resolved X-ray diffraction using a femtosecond laser-plasma keV X-ray source, J PHYS IV, 11(PR2), 2001, pp. 491-494
Generation and application of ultrashort X-ray pulses
Authors: Von der Linde, D Sokolowski-Tinten, K Blome, C Dietrich, C Zhou, P Tarasevitch, A Cavalleri, A Siders, CW Barty, CPJ Squier, J Wilson, KR Uschmann, I Forster, E
Citation: D. Von Der Linde et al., Generation and application of ultrashort X-ray pulses, LASER PART, 19(1), 2001, pp. 15-22
Ultrafast x-ray measurement of laser heating in semiconductors: Parametersdetermining the melting threshold - art. no. 193306
Authors: Cavalleri, A Siders, CW Rose-Petruck, C Jimenez, R Toth, C Squier, JA Barty, CPJ Wilson, KR Sokolowski-Tinten, K von Hoegen, MH von der Linde, D
Citation: A. Cavalleri et al., Ultrafast x-ray measurement of laser heating in semiconductors: Parametersdetermining the melting threshold - art. no. 193306, PHYS REV B, 6319(19), 2001, pp. 3306
Femtosecond x-ray measurement of ultrafast melting and large acoustic transients - art. no. 225701
Authors: Sokolowski-Tinten, K Blome, C Dietrich, C Tarasevitch, A von Hoegen, MH von der Linde, D Cavalleri, A Squier, J Kammler, M
Citation: K. Sokolowski-tinten et al., Femtosecond x-ray measurement of ultrafast melting and large acoustic transients - art. no. 225701, PHYS REV L, 8722(22), 2001, pp. 5701
Evidence for surface initiated solidification in Ge films upon picosecond laser pulse irradiation
Authors: Siegel, J Solis, J Afonso, CN Vega, F Bankmann, J Sacristan, OM Sokolowski-Tinten, K
Citation: J. Siegel et al., Evidence for surface initiated solidification in Ge films upon picosecond laser pulse irradiation, J APPL PHYS, 89(7), 2001, pp. 3642-3649
Generation of dense electron-hole plasmas in silicon
Authors: Sokolowski-Tinten, K von der Linde, D
Citation: K. Sokolowski-tinten et D. Von Der Linde, Generation of dense electron-hole plasmas in silicon, PHYS REV B, 61(4), 2000, pp. 2643-2650
The physical mechanisms of short-pulse laser ablation
Authors: von der Linde, D Sokolowski-Tinten, K
Citation: D. Von Der Linde et K. Sokolowski-tinten, The physical mechanisms of short-pulse laser ablation, APPL SURF S, 154, 2000, pp. 1-10
Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction
Authors: Cavalleri, A Siders, CW Brown, FLH Leitner, DM Toth, C Squier, JA Barty, CPJ Wilson, KR Sokolowski-Tinten, K von Hoegen, MH von der Linde, D Kammler, M
Citation: A. Cavalleri et al., Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction, PHYS REV L, 85(3), 2000, pp. 586-589
Single-pulse time- and fluence-resolved optical measurements at femtosecond excited surfaces
Authors: Sokolowski-Tinten, K Cavalleri, A von der Linde, D
Citation: K. Sokolowski-tinten et al., Single-pulse time- and fluence-resolved optical measurements at femtosecond excited surfaces, APPL PHYS A, 69(5), 1999, pp. 577-579
Detection of nonthermal molting by ultrafast X-ray diffraction
Authors: Siders, CW Cavalleri, A Sokolowski-Tinten, K Toth, C Guo, T Kammler, M von Hoegen, MH Wilson, KR von der Linde, D Barty, CPJ
Citation: Cw. Siders et al., Detection of nonthermal molting by ultrafast X-ray diffraction, SCIENCE, 286(5443), 1999, pp. 1340-1342
Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy
Authors: Cavalleri, A Sokolowski-Tinten, K Bialkowski, J Schreiner, M von der Linde, D
Citation: A. Cavalleri et al., Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy, J APPL PHYS, 85(6), 1999, pp. 3301-3309
Risultati: 1-12 |