Authors:
Quiros, C
Prieto, P
Fernandez, A
Elizalde, E
Morant, C
Schlogl, R
Spillecke, O
Sanz, JM
Citation: C. Quiros et al., Bonding and morphology study of carbon nitride films obtained by dual ion beam sputtering, J VAC SCI A, 18(2), 2000, pp. 515-523
Authors:
Uchida, Y
Spillecke, O
Lehmpfuhl, G
Preusser, A
Weiss, K
Schlogl, R
Citation: Y. Uchida et al., Determination of the mean absorption potential of Si for electrons by energy loss spectroscopy, CRYST RES T, 34(1), 1999, pp. 103-113