AAAAAA
Results: 26-35/35
Authors:
Lombardo, S
Crupi, F
Spinella, C
Neri, B
Citation: S. Lombardo et al., Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors, MAT SC S PR, 2(4), 1999, pp. 359-367
Authors:
Capellini, G
Di Gaspare, L
Evangelisti, F
Palange, E
Notargiacomo, A
Spinella, C
Lombardo, S
Citation: G. Capellini et al., Influence of dislocations on vertical ordering of Ge islands in Si Ge multilayers grown by low pressure chemical vapour deposition, SEMIC SCI T, 14(6), 1999, pp. L21-L23
Authors:
Baeri, P
Spinella, C
Reitano, R
Citation: P. Baeri et al., Fast melting of amorphous silicon carbide induced by nanosecond laser pulse, INT J THERM, 20(4), 1999, pp. 1211-1221
Authors:
Lombardo, S
Spinella, C
Campisano, SU
Pinto, A
Ward, P
Citation: S. Lombardo et al., Si/GexSi1-x heterojunction bipolar transistors formed by Ge ion implantation in Si. Narrowing of band gap and base width, NUCL INST B, 147(1-4), 1999, pp. 56-61
Authors:
Spinella, C
Lombardo, SA
Priolo, F
Citation: C. Spinella et al., Shape of grain size distributions during crystal grain nucleation in a-Si, THIN SOL FI, 337(1-2), 1999, pp. 90-92
Authors:
Puglisi, RA
Lombardo, SA
Spinella, C
Campisano, SU
Monchoix, H
Rabinzohn, P
Citation: Ra. Puglisi et al., Native oxide free polycrystalline/single crystal Si interface obtained by in situ cleaning: effects on the electrical performances of polysilicon emitter transistors, SOL ST ELEC, 43(11), 1999, pp. 2085-2091
Authors:
Lombardo, S
La Magna, A
Spinella, C
Gerardi, C
Crupi, F
Citation: S. Lombardo et al., Degradation and hard breakdown transient of thin gate oxides in metal-SiO2-Si capacitors: Dependence on oxide thickness, J APPL PHYS, 86(11), 1999, pp. 6382-6391
Authors:
Alberti, A
La Via, F
Spinella, C
Rimini, E
Citation: A. Alberti et al., Structural relationship of polycrystalline cobalt silicide lines to (001) silicon substrate, APPL PHYS L, 75(19), 1999, pp. 2924-2926
Authors:
Grimaldi, MG
Coffa, S
Spinella, C
Marabelli, F
Galli, M
Miglio, L
Meregalli, V
Citation: Mg. Grimaldi et al., Correlation between structural and optical properties of ion beam synthesized beta-FeSi2 precipitates in Si, J LUMINESC, 80(1-4), 1998, pp. 467-471
Authors:
Mannino, G
Priolo, F
Privitera, V
Raineri, V
Spinella, C
Napolitani, E
Carnera, A
Arena, G
Messina, A
Rapisarda, C
Citation: G. Mannino et al., Plasma processing of the silicon surface: A novel method to reduce transient enhanced diffusion of boron, J APPL PHYS, 84(12), 1998, pp. 6628-6635