Authors:
Srnanek, R
Gurnik, P
Harmatha, L
Gregora, I
Citation: R. Srnanek et al., Diagnostics of Si multi-delta-doped GaAs layers by Raman spectroscopy on bevelled structures, APPL SURF S, 183(1-2), 2001, pp. 86-92
Authors:
Srnanek, R
Kinder, R
Sciana, B
Radziewicz, D
McPhail, DS
Littlewood, SD
Novotny, I
Citation: R. Srnanek et al., Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy, APPL SURF S, 177(1-2), 2001, pp. 139-145
Authors:
El-Gomati, M
Gelsthorpe, A
Srnanek, R
Liday, J
Vogrincic, P
Kovac, J
Citation: M. El-gomati et al., A computer controlled chemical bevel etching apparatus: applications to Auger analysis of multi-layered structures, APPL SURF S, 145, 1999, pp. 128-131