Authors:
Zhang, FY
Hsu, ST
Ono, Y
Ulrich, B
Zhuang, WW
Ying, H
Stecker, L
Evans, DR
Maa, J
Citation: Fy. Zhang et al., Fabrication and characterization of sub-micron metal-ferroelectric-insulator-semiconductor field effect transistors with Pt/Pb5Ge3O11/ZrO2/Si structure, JPN J A P 2, 40(6B), 2001, pp. L635-L637