Authors:
Svrcek, V
Pelant, I
Stuchlik, J
Fejfar, A
Kocka, J
Citation: V. Svrcek et al., Detection of bottom depletion layer and its influence on surface photovoltage measurement in mu c-Si : H, THIN SOL FI, 383(1-2), 2001, pp. 271-273
Citation: V. Cech et J. Stuchlik, Determination of density of localized states in a-Si : H from the time relaxation of space-charge-limited conductivity, PHYS ST S-A, 187(2), 2001, pp. 487-491
Authors:
Svrcek, V
Pelant, I
Kocka, J
Fojtik, P
Rezek, B
Stuchlikova, H
Fejfar, A
Stuchlik, J
Poruba, A
Tousek, J
Citation: V. Svrcek et al., Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length, J APPL PHYS, 89(3), 2001, pp. 1800-1805
Authors:
Kocka, J
Stuchlik, J
Stuchlikova, H
Svrcek, V
Fojtik, P
Mates, T
Luterova, K
Fejfar, A
Citation: J. Kocka et al., Amorphous/microcrystalline silicon superlattices - the chance to control isotropy and other transport properties, APPL PHYS L, 79(16), 2001, pp. 2540-2542
Authors:
Fejfar, A
Rezek, B
Knapek, P
Stuchlik, J
Kocka, J
Citation: A. Fejfar et al., Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy, J NON-CRYST, 266, 2000, pp. 309-314
Citation: B. Rezek et al., Local characterization of electronic transport in microcrystalline siliconthin films with submicron resolution, APPL PHYS L, 74(10), 1999, pp. 1475-1477
Authors:
Rezek, B
Stuchlik, J
Fejfar, A
Kocka, J
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Characterization of laser patterned a-Si : H thin films by combined AFM local current measurements, PHYS ST S-A, 170(1), 1998, pp. R1-R2