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Results: 1-11 |
Results: 11

Authors: Kocka, J Fejfar, A Fojtik, P Luterova, K Pelant, I Rezek, B Stuchlikova, H Stuchlik, J Svrcek, V
Citation: J. Kocka et al., Charge transport in microcrystalline Si - the specific features, SOL EN MAT, 66(1-4), 2001, pp. 61-71

Authors: Svrcek, V Pelant, I Stuchlik, J Fejfar, A Kocka, J
Citation: V. Svrcek et al., Detection of bottom depletion layer and its influence on surface photovoltage measurement in mu c-Si : H, THIN SOL FI, 383(1-2), 2001, pp. 271-273

Authors: Cech, V Stuchlik, J
Citation: V. Cech et J. Stuchlik, Determination of density of localized states in a-Si : H from the time relaxation of space-charge-limited conductivity, PHYS ST S-A, 187(2), 2001, pp. 487-491

Authors: Svrcek, V Pelant, I Kocka, J Fojtik, P Rezek, B Stuchlikova, H Fejfar, A Stuchlik, J Poruba, A Tousek, J
Citation: V. Svrcek et al., Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length, J APPL PHYS, 89(3), 2001, pp. 1800-1805

Authors: Kocka, J Stuchlik, J Stuchlikova, H Svrcek, V Fojtik, P Mates, T Luterova, K Fejfar, A
Citation: J. Kocka et al., Amorphous/microcrystalline silicon superlattices - the chance to control isotropy and other transport properties, APPL PHYS L, 79(16), 2001, pp. 2540-2542

Authors: Fejfar, A Rezek, B Knapek, P Stuchlik, J Kocka, J
Citation: A. Fejfar et al., Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy, J NON-CRYST, 266, 2000, pp. 309-314

Authors: Cvak, L Stuchlik, J Schreiberova, M Sedmera, P Havlicek, V Flieger, M Cejka, J Kratochvil, B Jegorov, A
Citation: L. Cvak et al., Selective reduction of peptidic ergot alkaloids, COLL CZECH, 65(11), 2000, pp. 1762-1776

Authors: Juska, G Viliunas, M Arlauskas, K Stuchlik, J Kocka, J
Citation: G. Juska et al., Ultrafast charge carrier recombination in a-Si : H and mu c-Si : H, PHYS ST S-A, 171(2), 1999, pp. 539-547

Authors: Ivlev, G Gatskevich, E Chab, V Stuchlik, J Vorlicek, V Kocka, J
Citation: G. Ivlev et al., Dynamics of the excimer laser annealing of hydrogenated amorphous silicon thin films, APPL PHYS L, 75(4), 1999, pp. 498-500

Authors: Rezek, B Stuchlik, J Fejfar, A Kocka, J
Citation: B. Rezek et al., Local characterization of electronic transport in microcrystalline siliconthin films with submicron resolution, APPL PHYS L, 74(10), 1999, pp. 1475-1477

Authors: Rezek, B Stuchlik, J Fejfar, A Kocka, J Nebel, CE Stutzmann, M
Citation: B. Rezek et al., Characterization of laser patterned a-Si : H thin films by combined AFM local current measurements, PHYS ST S-A, 170(1), 1998, pp. R1-R2
Risultati: 1-11 |