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Results: 1-19 |
Results: 19

Authors: Iwasaki, H Gotoh, M Sudoh, K
Citation: H. Iwasaki et al., Electron tunneling through SiO2/Si structures in scanning tunneling microscopy, JPN J A P 1, 40(8), 2001, pp. 5116-5120

Authors: Ito, T Gotoh, M Sudoh, K Iwasaki, H
Citation: T. Ito et al., Quantum yield of electron-beam induced decomposition of SiO2 overlay on Siin nanolithography using a scanning tunneling microscope, JPN J A P 1, 40(10), 2001, pp. 6055-6058

Authors: Harada, H Kazami, J Watanuki, S Tsuzuki, R Sudoh, K Fujimori, A Sanagi, M Orita, M Nakahara, H Shimaya, J Tsukamoto, S Tanaka, A Yanagisawa, I
Citation: H. Harada et al., Ethenesulfonamide and ethanesulfonamide derivatives, a novel class of orally active endothelin-A receptor antagonists, BIO MED CH, 9(11), 2001, pp. 2955-2968

Authors: Sudoh, K Yoshida, Y Matsunami, N Takai, Y
Citation: K. Sudoh et al., Superconducting properties and surface morphology of SmBa2Cu3O6+delta thinfilms, PHYSICA C, 357, 2001, pp. 1358-1360

Authors: Tamura, K Yoshida, Y Sudoh, K Kurosaki, H Matsunami, N Hirabayashi, I Takai, Y
Citation: K. Tamura et al., Influence of the microstructure of the SrTiO3 buffer layer on the superconducting properties of YBa2Cu3O7-x films, PHYSICA C, 357, 2001, pp. 1386-1389

Authors: Sudoh, K Huang, HW Morii, T
Citation: K. Sudoh et al., Electroproduction of psi ' and polarized gluon distribution in a proton, PHYS LETT B, 515(1-2), 2001, pp. 99-104

Authors: Sudoh, K Iwasaki, H
Citation: K. Sudoh et H. Iwasaki, Kinetics of faceting driven by attractive step-step interactions on vicinal Si(113) - art. no. 216103, PHYS REV L, 8721(21), 2001, pp. 6103

Authors: Harada, H Kazami, J Watanuki, S Tsuzuki, R Sudoh, K Fujimori, A Tanaka, A Tsukamoto, S Yanagisawa, I
Citation: H. Harada et al., Ethenesulfonamide derivatives, a novel class of orally active endothelin-Areceptor antagonists, CHEM PHARM, 49(5), 2001, pp. 606-612

Authors: Harada, H Kazami, J Watanuki, S Tsuzuki, R Sudoh, K Fujimori, A Tokunaga, T Tanaka, A Tsukamoto, S Yanagisawa, I
Citation: H. Harada et al., Synthesis and structure-activity relationships in a series of ethenesulfonamide derivatives, a novel class of endothelin receptor antagonists, CHEM PHARM, 49(12), 2001, pp. 1593-1603

Authors: Sudoh, K Iwasaki, H
Citation: K. Sudoh et H. Iwasaki, Nanopit formation and manipulation of steps on Si(001) at high temperatures with a scanning tunneling microscope, JPN J A P 1, 39(7B), 2000, pp. 4621-4623

Authors: Yoshinobu, T Matsukawa, S Sudoh, K Iwasaki, H
Citation: T. Yoshinobu et al., Current-induced step bunching on vicinal Si(111) studied by light scattering, JPN J A P 2, 39(4B), 2000, pp. L380-L383

Authors: Gotoh, M Sudoh, K Iwasaki, H
Citation: M. Gotoh et al., Roughening of the Si/SiO2 interface during SC1-chemical treatment studied by scanning tunneling microscopy, J VAC SCI B, 18(4), 2000, pp. 2165-2168

Authors: Sudoh, K Morii, T
Citation: K. Sudoh et T. Morii, Two-spin asymmetry for psi ' photoproduction with the color-octet mechanism - art. no. 057501, PHYS REV D, 6205(5), 2000, pp. 7501

Authors: Ohkuma, K Sudoh, K Morii, T
Citation: K. Ohkuma et al., Lambda(+)(c) production in polarized pp scattering and polarized gluon distribution, PHYS LETT B, 491(1-2), 2000, pp. 117-122

Authors: Sudoh, K Iwasaki, H Williams, ED
Citation: K. Sudoh et al., Facet growth due to attractive step-step interactions on vicinal Si(113), SURF SCI, 452(1-3), 2000, pp. L287-L292

Authors: Ueda, N Sudoh, K Li, N Yoshinobu, T Iwasaki, H
Citation: N. Ueda et al., Controllable nanopit formation on Si(001) with a scanning tunneling microscope, JPN J A P 1, 38(9A), 1999, pp. 5236-5238

Authors: Sudoh, K Yoshinobu, T Iwasaki, H
Citation: K. Sudoh et al., Statistical analysis of step meandering on Si(113) miscut along a low symmetry azimuth, SURF SCI, 419(2-3), 1999, pp. 128-133

Authors: Sudoh, K Yoshinobu, T Iwasaki, H
Citation: K. Sudoh et al., Scanning tunneling microscopy study of faceting on vicinal Si(113), JPN J A P 1, 37(11), 1998, pp. 5870-5874

Authors: Iwamori, S Miyashita, T Fukuda, S Nozaki, S Sudoh, K Fukuda, N
Citation: S. Iwamori et al., Effect of an interfacial layer on adhesion strength deterioration between a copper thin film and polyimide substrate, VACUUM, 51(4), 1998, pp. 615-618
Risultati: 1-19 |