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Results:
1-9
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Results: 9
Authors:
Usuki, T
Horiguchi, N
Goto, K
Tanaka, T
Futatsugi, T
Sugii, T
Yokoyama, N
Citation: T. Usuki et al., A direct tunneling memory using ultra-thin oxide and deca-nano floating gate structure, SUPERLATT M, 28(5-6), 2000, pp. 401-406
Authors:
Shimosaka, T
Sugii, T
Hobo, T
Ross, JBA
Uchiyama, K
Citation: T. Shimosaka et al., Monitoring of dye adsorption phenomena at a silica glass/water interface with total internal reflection coupled with a thermal lens effect, ANALYT CHEM, 72(15), 2000, pp. 3532-3538
Authors:
Tanaka, T
Momiyama, Y
Sugii, T
Citation: T. Tanaka et al., High frequency characteristics of dynamic threshold-voltage MOSFET (DTMOS)under ultra-low supply voltage, IEICE TR EL, E82C(3), 1999, pp. 538-543
Authors:
Kurata, H
Sugii, T
Citation: H. Kurata et T. Sugii, Impact of shallow source/drain on the short-channel characteristics of pMOSFET's, IEEE ELEC D, 20(2), 1999, pp. 95-96
Authors:
Goto, K
Matsuo, J
Tada, Y
Sugii, T
Yamada, I
Citation: K. Goto et al., Decaborane (B10H14) ion implantation technology for sub-0.1-mu m PMOSFET's, IEEE DEVICE, 46(4), 1999, pp. 683-689
Authors:
Goto, K
Fushida, A
Watanabe, J
Sukegawa, T
Tada, Y
Nakamura, T
Yamazaki, T
Sugii, T
Citation: K. Goto et al., A new leakage mechanism of Co salicide and optimized process conditions, IEEE DEVICE, 46(1), 1999, pp. 117-124
Authors:
Lindert, N
Sugii, T
Tang, S
Hu, CM
Citation: N. Lindert et al., Dynamic threshold pass-transistor logic for improved delay at lower power supply voltages, IEEE J SOLI, 34(1), 1999, pp. 85-89
Authors:
Shimosaka, T
Sugii, T
Uchiyama, K
Hobo, T
Citation: T. Shimosaka et al., Application of thermal-lens spectroscopy coupled with incident-angle-dependent total-internal reflection to adsorption phenomenon of dyes on glass/solution interface, BUNSEKI KAG, 47(12), 1998, pp. 1099-1102
Authors:
Goto, K
Sugii, T
Matsuo, J
Citation: K. Goto et al., High performance 0.04 mu m PMOSFET, FUJITSU SCI, 34(2), 1998, pp. 135-141
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1-9
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