Authors:
Olafsson, HO
Sveinbjornsson, EO
Rudenko, TE
Tyagulski, IP
Osiyuk, IN
Lysenko, VS
Citation: Ho. Olafsson et al., Border traps in 6H-SiC metal-oxide-semiconductor capacitors investigated by the thermally-stimulated current technique, APPL PHYS L, 79(24), 2001, pp. 4034-4036
Authors:
Sachse, JU
Sveinbjornsson, EO
Yarykin, N
Weber, J
Citation: Ju. Sachse et al., Similarities in the electrical properties of transition metal-hydrogen complexes in silicon, MAT SCI E B, 58(1-2), 1999, pp. 134-140
Authors:
Sadeghi, M
Jauhiainen, A
Liss, B
Sveinbjornsson, EO
Engstrom, O
Citation: M. Sadeghi et al., High frequency capacitance measurements on metal-insulator-semiconductor structures in thermal non-equilibrium condition, SOL ST ELEC, 42(12), 1998, pp. 2233-2238