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Authors: MURANAKA M MAKABE K MIURA M KATO H IDE S IWAI H KAWAMURA M TADAKI Y ISHIHARA M KAERIYAMA T
Citation: M. Muranaka et al., THE ANALYSIS OF THE DEFECTIVE CELLS INDUCED BY COP IN A 0.3-MICRON-TECHNOLOGY NODE DRAM, JPN J A P 1, 37(3B), 1998, pp. 1240-1243

Authors: NAKAMURA M TAKAHASHI T AKIBA T KITSUKAWA G MORINO M SEKIGUCHI T ASANO I KOMATSUZAKI K TADAKI Y CHO S KAJIGAYA K TACHIBANA T SATO K
Citation: M. Nakamura et al., A 29-NS 64-MB DRAM WITH HIERARCHICAL ARRAY ARCHITECTURE, IEEE journal of solid-state circuits, 31(9), 1996, pp. 1302-1307
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