Authors: TAENZLER F MERTIN W DAVID G JAGER D KUBALEK E

Citation: F. Taenzler et al., EXPERIMENTAL CHARACTERIZATION OF THE PERTURBATIONS OF MICROWAVE DEVICES BY THE ELECTROOPTIC PROBE TIP, Microelectronic engineering, 24(1-4), 1994, pp. 123-130

Authors: MERTIN W LEYK A TAENZLER F NOVAK T DAVID G JAGER D KUBALEK E

Citation: W. Mertin et al., CHARACTERIZATION OF A MMIC BY DIRECT AND INDIRECT ELECTROOPTIC SAMPLING AND BY NETWORK ANALYZER MEASUREMENTS, Microelectronic engineering, 24(1-4), 1994, pp. 377-384