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Results:
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Results: 23
Authors:
VANROY I
TERRYN H
GOEMINNE G
Citation: I. Vanroy et al., STUDY OF THE PHOSPHATING TREATMENT OF ALUMINUM SURFACES - ROLE OF THEACTIVATING PROCESS, Colloids and surfaces. A, Physicochemical and engineering aspects, 136(1-2), 1998, pp. 89-96
Authors:
DELAET J
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., DEVELOPMENT OF AN OPTICAL-MODEL FOR STEADY-STATE POROUS ANODIC FILMS ON ALUMINUM FORMED IN PHOSPHORIC-ACID, Thin solid films, 320(2), 1998, pp. 241-252
Authors:
SCHRAM T
DELAET J
TERRYN H
Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHROMIUM CONVERSION LAYERSON ALUMINUM, Thin solid films, 313, 1998, pp. 727-731
Authors:
LAEVERS P
HUBIN A
TERRYN H
VEREECKEN J
Citation: P. Laevers et al., A WALL-JET ELECTRODE REACTOR AND ITS APPLICATION TO THE STUDY OF ELECTRODE-REACTION MECHANISMS PART III - STUDY OF THE MECHANISM OF THE AC ELECTROLYTIC GRAINING OF ALUMINUM IN HYDROCHLORIC-ACID, Journal of Applied Electrochemistry, 28(4), 1998, pp. 387-396
Authors:
VANROY I
TERRYN H
GOEMINNE G
Citation: I. Vanroy et al., STUDY OF THE FORMATION OF ZINC PHOSPHATE LAYERS ON AA5754 ALUMINUM-ALLOY, Transactions of the Institute of Metal Finishing, 76, 1998, pp. 19-23
EIS STUDY OF THE INFLUENCE OF ALUMINUM ETCHING ON THE GROWTH OF CHROMIUM PHOSPHATE CONVERSION LAYERS
Authors:
GOEMINNE G
TERRYN H
VEREECKEN J
Citation: G. Goeminne et al., EIS STUDY OF THE INFLUENCE OF ALUMINUM ETCHING ON THE GROWTH OF CHROMIUM PHOSPHATE CONVERSION LAYERS, Electrochimica acta, 43(12-13), 1998, pp. 1829-1838
Authors:
SCHRAM T
DELAET J
TERRYN H
Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHEMICAL CONVERSION COATINGS ON ALUMINUM, Journal of the Electrochemical Society, 145(8), 1998, pp. 2733-2739
Authors:
POELS K
VANVAECK L
STRUYF H
VANESPEN P
ADAMS F
TERRYN H
DEBRUYNE P
Citation: K. Poels et al., FEASIBILITY OF FOURIER-TRANSFORM LASER MICROPROBE MASS-SPECTROMETRY FOR THE ANALYSIS OF LUBRICATING EMULSIONS ON ROLLED ALUMINUM, Rapid communications in mass spectrometry, 10(11), 1996, pp. 1351-1360
Authors:
LAEVERS P
HUBIN A
TERRYN H
VEREECKEN J
Citation: P. Laevers et al., ON THE MECHANISM OF THE AC ELECTROLYTIC GRAINING OF ROLLED ALUMINUM SUBSTRATES, Transactions of the Institute of Metal Finishing, 74, 1996, pp. 161-168
Authors:
DELAET J
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., THE USE OF IMPEDANCE SPECTROSCOPY AND OPTICAL REFLECTION SPECTROSCOPYTO STUDY MODIFIED ALUMINUM SURFACES, Electrochimica acta, 41(7-8), 1996, pp. 1155-1161
Authors:
LAEVERS P
TERRYN H
VEREECKEN J
KERNIG B
GRZEMBA B
Citation: P. Laevers et al., THE INFLUENCE OF MANGANESE ON THE AC ELECTROLYTIC GRAINING OF ALUMINUM, Corrosion science, 38(3), 1996, pp. 413-429
Authors:
LAEVERS P
HUBIN A
TERRYN H
VEREECKEN J
Citation: P. Laevers et al., A WALL-JET ELECTRODE REACTOR AND ITS APPLICATION TO THE STUDY OF ELECTRODE-REACTION MECHANISMS .1. DESIGN AND CONSTRUCTION, Journal of Applied Electrochemistry, 25(11), 1995, pp. 1017-1022
Authors:
LAEVERS P
HUBIN A
TERRYN H
VEREECKEN J
Citation: P. Laevers et al., A WALL-JET ELECTRODE REACTOR AND ITS APPLICATION TO THE STUDY OF ELECTRODE-REACTION MECHANISMS .2. A GENERAL COMPUTATIONAL METHOD FOR THE MASS-TRANSPORT PROBLEMS INVOLVED, Journal of Applied Electrochemistry, 25(11), 1995, pp. 1023-1030
Authors:
SCHRAM T
GOEMINNE G
TERRYN H
VANHOOLST W
VANESPEN P
Citation: T. Schram et al., STUDY OF THE COMPOSITION OF ZIRCONIUM-BASED CHROMIUM FREE CONVERSION LAYERS ON ALUMINUM, Transactions of the Institute of Metal Finishing, 73, 1995, pp. 91-95
CHARACTERIZATION OF CONVERSION LAYERS ON ALUMINUM BY MEANS OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY
Authors:
GOEMINNE G
TERRYN H
VEREECKEN J
Citation: G. Goeminne et al., CHARACTERIZATION OF CONVERSION LAYERS ON ALUMINUM BY MEANS OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY, Electrochimica acta, 40(4), 1995, pp. 479-486
Authors:
DELAET J
DEBOECIK K
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., DETERMINATION OF THE DEPTH RESOLUTION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF ANODIC BARRIER OXIDE-FILMS ON DIFFERENTLY PRETREATEDALUMINUM SUBSTRATES, Surface and interface analysis, 22(1-12), 1994, pp. 175-180
Authors:
GOEMINNE G
DELAET J
TERRYN H
VEREECKEN J
Citation: G. Goeminne et al., NONDESTRUCTIVE CHARACTERIZATION OF CHROMIUM PHOSPHATE COATED ALUMINUMWITH SE AND FTIRS CORRELATED TO SURFACE ANALYTICAL ANALYSES BY AES AND TEM, Surface and interface analysis, 22(1-12), 1994, pp. 445-450
Authors:
RENIERS F
HUBIN A
TERRYN H
VEREECKEN J
Citation: F. Reniers et al., FACTOR-ANALYSIS AS A TOOL TO DECONVOLUTE AUGER-SPECTRA OF TUNGSTEN NITRIDES AND CARBIDES, Surface and interface analysis, 21(6-7), 1994, pp. 483-489
Authors:
DELAET J
GOEMINNE G
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF OXYDE FILMS AND CONVERSION LAYERS ON ALUMINUM-ALLOYS, Journal de physique. IV, 3(C7), 1993, pp. 981-985
Authors:
TERRYN H
VEREECKEN J
DEJAEGER N
Citation: H. Terryn et al., CHARACTERIZATION OF ALUMINUM SURFACE TREATMENTS BY MEANS OF GAS-ADSORPTION MEASUREMENTS, Colloids and surfaces. A, Physicochemical and engineering aspects, 80(2-3), 1993, pp. 171-179
Authors:
DELAET J
VANHELLEMONT J
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF DIFFERENT CONVERSION COATINGS ON ALUMINUM WITH SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 58-62
Authors:
DELAET J
SCHEERS J
TERRYN H
VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF ALUMINUM SURFACE TREATMENTS WITH ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY, Electrochimica acta, 38(14), 1993, pp. 2103-2109
Authors:
LAEVERS P
TERRYN H
VEREECKEN J
THOMPSON GE
Citation: P. Laevers et al., A STUDY OF THE MECHANISM OF AC ELECTROLYTIC GRAINING OF ALUMINUM IN HYDROCHLORIC AND NITRIC-ACID, Corrosion science, 35(1-4), 1993, pp. 231-238
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