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Results: 1-9 |
Results: 9

Authors: THOMAS DF KOLODIAZHNYI TV BELOUS AG
Citation: Df. Thomas et al., SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY OF N-DOPED BATIO3 CERAMICS, Journal of the European Ceramic Society, 18(11), 1998, pp. 1637-1643

Authors: THOMAS DF MENZ FE
Citation: Df. Thomas et Fe. Menz, COMMUNITY-BASED EMPLOYMENT - PREFACE, The journal of head trauma rehabilitation, 12(5), 1997, pp. 7-9

Authors: THOMAS DF MENZ FE
Citation: Df. Thomas et Fe. Menz, VALIDATION OF THE VOCATIONAL ASSESSMENT PROTOCOL, The journal of head trauma rehabilitation, 12(5), 1997, pp. 72-87

Authors: THOMAS DF BOTTERBUSCH KF
Citation: Df. Thomas et Kf. Botterbusch, THE VOCATIONAL ASSESSMENT PROTOCOL FOR SCHOOL-TO-WORK TRANSITION PROGRAMS, The journal of head trauma rehabilitation, 12(2), 1997, pp. 48-66

Authors: JONES LA YUKSEKER O THOMAS DF
Citation: La. Jones et al., DEPENDENCE OF PHOTOCHEMICALLY ETCHED POROUS SILICON FORMATION ON PHOTOETCHING WAVELENGTH AND POWER, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1505-1510

Authors: CAMPBELL SD JONES LA NAKAMICHI E WEI FX ZAJCHOWSKI LD THOMAS DF
Citation: Sd. Campbell et al., SPECTRAL AND STRUCTURAL FEATURES OF POROUS SILICON PREPARED BY CHEMICAL AND ELECTROCHEMICAL ETCHING PROCESSES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1184-1189

Authors: JONES LA TAYLOR GM WEI FX THOMAS DF
Citation: La. Jones et al., CHEMICAL ETCHING OF SILICON - SMOOTH, ROUGH, AND GLOWING SURFACES, Progress in Surface Science, 50(1-4), 1995, pp. 283-293

Authors: JONES LA WEI FX THOMAS DF
Citation: La. Jones et al., MOVABLE ULTRA-HIGH-VACUUM SAMPLE MOUNT - HEATING, COOLING, AND TEMPERATURE-MEASUREMENT CAPABILITIES, Review of scientific instruments, 66(2), 1995, pp. 1146-1150

Authors: JONES LA WEI FX THOMAS DF
Citation: La. Jones et al., DESIGN AND IMPLEMENTATION OF A HEATABLE, ALL-GLASS DOSER FOR SENSITIVE ORGANOMETALLIC COMPOUNDS IN AN ULTRAHIGH-VACUUM ENVIRONMENT, Review of scientific instruments, 66(10), 1995, pp. 4981-4984
Risultati: 1-9 |