Authors: BARRETT M DENNIS M TIFFIN D LI Y SHIH CK

Citation: M. Barrett et al., 2-DIMENSIONAL DOPANT PROFILING OF VERY LARGE-SCALE INTEGRATED DEVICESUSING SELECTIVE ETCHING AND ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 447-451

Authors: BARRETT M DENNIS M TIFFIN D LI Y SHIH CK

Citation: M. Barrett et al., 2-D DOPANT PROFILING IN VLSI DEVICES USING DOPANT-SELECTIVE ETCHING -AN ATOMIC-FORCE MICROSCOPY STUDY, IEEE electron device letters, 16(3), 1995, pp. 118-120

Authors: JARVIS P HUGHESCLARKE J TIFFIN D TANAHASHI M KROENKE L

Citation: P. Jarvis et al., THE WESTERN FIJI TRANSFORM-FAULT AND ITS ROLE IN THE DISMEMBERMENT OFTHE FIJI PLATFORM, Marine geology, 116(1-2), 1994, pp. 57-68

Authors: CLARKE JEH JARVIS P TIFFIN D PRICE R KROENKE L

Citation: Jeh. Clarke et al., TECTONIC ACTIVITY AND PLATE BOUNDARIES ALONG THE NORTHERN FLANK OF THE FIJI PLATFORM, Geo-marine letters, 13(2), 1993, pp. 98-106