Citation: M. Barrett et al., 2-DIMENSIONAL DOPANT PROFILING OF VERY LARGE-SCALE INTEGRATED DEVICESUSING SELECTIVE ETCHING AND ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 447-451
Citation: M. Barrett et al., 2-D DOPANT PROFILING IN VLSI DEVICES USING DOPANT-SELECTIVE ETCHING -AN ATOMIC-FORCE MICROSCOPY STUDY, IEEE electron device letters, 16(3), 1995, pp. 118-120
Authors:
JARVIS P
HUGHESCLARKE J
TIFFIN D
TANAHASHI M
KROENKE L
Citation: P. Jarvis et al., THE WESTERN FIJI TRANSFORM-FAULT AND ITS ROLE IN THE DISMEMBERMENT OFTHE FIJI PLATFORM, Marine geology, 116(1-2), 1994, pp. 57-68
Authors:
CLARKE JEH
JARVIS P
TIFFIN D
PRICE R
KROENKE L
Citation: Jeh. Clarke et al., TECTONIC ACTIVITY AND PLATE BOUNDARIES ALONG THE NORTHERN FLANK OF THE FIJI PLATFORM, Geo-marine letters, 13(2), 1993, pp. 98-106