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Results: 1-9 |
Results: 9
PHENOMENOLOGICAL DESCRIPTION OF SURFACE CHARACTERISTICS MEASURED BY THE METHOD OF ATOMIC-FORCE MICROSCOPY
Authors: ARUTYUNOV PA TOLSTIKHINA AL
Citation: Pa. Arutyunov et Al. Tolstikhina, PHENOMENOLOGICAL DESCRIPTION OF SURFACE CHARACTERISTICS MEASURED BY THE METHOD OF ATOMIC-FORCE MICROSCOPY, Crystallography reports, 43(3), 1998, pp. 483-492
STRUCTURE OF ORDERED POLYELECTROLYTE FILMS FROM ATOMIC-FORCE MICROSCOPY AND X-RAY REFLECTIVITY DATA
Authors: BELYAEV VV TOLSTIKHINA AL STEPINA ND KAYUSHINA RL
Citation: Vv. Belyaev et al., STRUCTURE OF ORDERED POLYELECTROLYTE FILMS FROM ATOMIC-FORCE MICROSCOPY AND X-RAY REFLECTIVITY DATA, Crystallography reports, 43(1), 1998, pp. 124-128
STRUCTURE OF CELLULOSE ACETOVALERATE LB F ILMS
Authors: STEPINA ND TOLSTIKHINA AL KLECHKOVSKAYA VV BELYAEV VV FEIGIN LA KHRIPUNOV AK LAVRENTIEV VK BAKLAGIN YG VOLKOV AY
Citation: Nd. Stepina et al., STRUCTURE OF CELLULOSE ACETOVALERATE LB F ILMS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 492-495
INVESTIGATION OF SNO2 FILMS SURFACE BY RE FLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY
Authors: TOLSTIKHINA AL
Citation: Al. Tolstikhina, INVESTIGATION OF SNO2 FILMS SURFACE BY RE FLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 61(10), 1997, pp. 1925-1930
THE STUDY OF THE SURFACE MICRORELIEF OF T GS AND RB2ZNCL4 FERROELECTRICS BY THE METHOD OF ATOMIC-FORCE MICROSCOPY
Authors: BELUGINA NV TOLSTIKHINA AL
Citation: Nv. Belugina et Al. Tolstikhina, THE STUDY OF THE SURFACE MICRORELIEF OF T GS AND RB2ZNCL4 FERROELECTRICS BY THE METHOD OF ATOMIC-FORCE MICROSCOPY, Kristallografia, 41(6), 1996, pp. 1072-1076
SPECIFIC FEATURES OF THE STRUCTURE OF AMO RPHOUS TITANIUM-DIOXIDE FILMS SYNTHESIZED UNDER VARIOUS CONDITIONS
Authors: TOLSTIKHINA AL SOROKINA KL
Citation: Al. Tolstikhina et Kl. Sorokina, SPECIFIC FEATURES OF THE STRUCTURE OF AMO RPHOUS TITANIUM-DIOXIDE FILMS SYNTHESIZED UNDER VARIOUS CONDITIONS, Kristallografia, 41(2), 1996, pp. 339-347
TO BUILDING OF AN EXPERT-SYSTEM FOR ELECT RON-DIFFRACTION STRUCTURE-ANALYSIS
Authors: TOLSTIKHINA AL ARUTYUNOV PA KLECHKOVSKAYA VV
Citation: Al. Tolstikhina et al., TO BUILDING OF AN EXPERT-SYSTEM FOR ELECT RON-DIFFRACTION STRUCTURE-ANALYSIS, Kristallografia, 40(6), 1995, pp. 992-998
STRUCTURE OF THERMOCHROMIC NICKEL-OXIDE F ILMS
Authors: TOLSTIKHINA AL KLECHKOVSKAYA VV PETROV VN
Citation: Al. Tolstikhina et al., STRUCTURE OF THERMOCHROMIC NICKEL-OXIDE F ILMS, Kristallografia, 40(4), 1995, pp. 751-760
THE BISMUTH SURFACE CONDUCTANCE AT AN ELECTROLYTIC CONTACT - THE BISMUTH FILM STRUCTURE AND SIZE EFFECTS
Authors: BLUVSTEIN AS MANSUROV GN SYRCHINA NV PETRII OA TOLSTIKHINA AL
Citation: As. Bluvstein et al., THE BISMUTH SURFACE CONDUCTANCE AT AN ELECTROLYTIC CONTACT - THE BISMUTH FILM STRUCTURE AND SIZE EFFECTS, Russian journal of electrochemistry, 29(9), 1993, pp. 929-933
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