Authors: TONOVA D PANEVA A PANTCHEV B

Citation: D. Tonova et al., DETERMINATION OF REFRACTIVE-INDEX PROFILES OF GRADIENT OPTICAL WAVE-GUIDES BY ELLIPSOMETRY, Optics communications, 150(1-6), 1998, pp. 121-125

Authors: KONOVA A TONOVA D KARMAKOV J

Citation: A. Konova et al., DAMAGE DEPTH PROFILES OF SHALLOW-IMPLANTED OR COMPOSITIONAL-GRADED SURFACES FOR X-RAY AND GAMMA-RAY DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 380(1-2), 1996, pp. 97-101

Authors: TONOVA D DEPAS M VANHELLEMONT J

Citation: D. Tonova et al., INTERPRETATION OF SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS OF ULTRATHIN DIELECTRIC LAYERS ON SILICON - IMPACT OF ACCURACY OF THE SILICON OPTICAL-CONSTANTS, Thin solid films, 288(1-2), 1996, pp. 64-68

Authors: TONOVA D KONOVA A

Citation: D. Tonova et A. Konova, DEPTH PROFILING OF INHOMOGENEOUS LAYERS BY ELLIPSOMETRY, Surface science, 349(2), 1996, pp. 221-228

Authors: KONOVA A TONOVA D ARBOV S

Citation: A. Konova et al., DETERMINATION OF THE OPTICAL-CONSTANTS OF SUBSTRATES BY ANGLE-OF-INCIDENCE DERIVATIVE ELLIPSOMETRY IN THE PRESENCE OF UNKNOWN SURFACE OVERLAYERS, Optics letters, 18(11), 1993, pp. 918-920

Authors: TONOVA D KONOVA A

Citation: D. Tonova et A. Konova, DAMAGE DEPTH PROFILES DETERMINATION BY ELLIPSOMETRY - A NEW NUMERICALALGORITHM, Surface science, 293(3), 1993, pp. 195-201